Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
Understand BIB PD<br />
Instant Supply<br />
PS<br />
Bulk<br />
Local<br />
<strong>Socket</strong><br />
Short Cold Shower<br />
Die<br />
Cold For A While<br />
– When the die consumes a large current <strong>in</strong> a very short<br />
period dur<strong>in</strong>g the output state transition, it will cause<br />
unwanted voltage drop(spikes/transient) along the<br />
power path.<br />
– Thus, the decoupl<strong>in</strong>g capacitors(bulk/local) are placed<br />
near to the die to lower the ground bounce/transient<br />
noise on the power supply(PS) for the device.<br />
• They will charge up dur<strong>in</strong>g the less stressful period and then<br />
provide additional charges dur<strong>in</strong>g the transient <strong>in</strong>stead of the<br />
PS, thus reduc<strong>in</strong>g the spike magnitude along the power path.<br />
02/01/2002 <strong>BiTS</strong> 2002 3
Change language