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Burn-in & Test Socket Workshop - BiTS Workshop

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Introduction<br />

• BIB over-current protection prevents premature<br />

component failures, short circuits and fire hazards.<br />

• In dynamic burn-<strong>in</strong>, current spikes occur at oven power<br />

supplies sequenc<strong>in</strong>g and auto signal checks.<br />

• Common phenomenon for high current, high speed units<br />

under test.<br />

• Fuses are effectively be<strong>in</strong>g utilized for overload or shortcircuit<br />

protection.<br />

• Incidences of nuisance fuse blow<strong>in</strong>g is disruptive to<br />

production.<br />

• Fuse replacement is an expensive & <strong>in</strong>convenient task.<br />

• Number of fuses on a burn-<strong>in</strong> board vary with each design.<br />

• Other better alternatives (technology) are be<strong>in</strong>g reviewed.<br />

KWLow/Zamel <strong>BiTS</strong> 2002 3

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