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book of abstracts - IM2NP

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A B S T R A C T S TUESDAY, JUNE 29 N A N O S E A 2 0 1 0<br />

emission with the required operating wavelengths (C-band, 1530 - 1560 nm). X-ray Interference Lithography<br />

(XIL) has been chosen as the preferential technique to produce the gratings that provide the optical feedback.<br />

2 – Abstract<br />

In the last years optical gain from organic active media has been observed at different wavelengths lying in<br />

the near-IR region (up to 1300 nm) [1-3] but still far from the wavelengths required for the optical<br />

communications. P. Del Carro et al. have recently fabricated a distributed feedback (DFB) laser tunable in<br />

the range <strong>of</strong> 890 - 930 nm [4]. Here we present an organic DFB laser exploiting the 4f – 4f transition at 1535<br />

nm <strong>of</strong> the Er ion coordinated to the three Quinoline groups <strong>of</strong> the ErQ3 molecule. A film <strong>of</strong> amorphous ErQ3<br />

is deposited by Vacuum Thermal Evaporation on a periodically modulated surface obtained by XIL.<br />

According to the Bragg condition with the first order <strong>of</strong> emission (m=1) at 1535 nm, a 472 nm‐pitch has<br />

been calculated for the DFB cavity and reproduced on the samples with nanometric precision. XIL represents<br />

the obvious choice to obtain periodic structures, with its capacity to engrave (in few minutes) large areas <strong>of</strong><br />

photoresist (~ 1 mm2) with nanometer (100 nm) size ordered patterns without making use <strong>of</strong> masks. The XIL<br />

tool is a low-cost apparatus made <strong>of</strong> a table-top coherent X-ray source and a simple Lloyd‟s setup where the<br />

interference patterns are produced by reflection <strong>of</strong> one half <strong>of</strong> the laser beam that overlaps with the<br />

undeflected half in correspondence <strong>of</strong> the sample surface [5]. The X-ray laser source is a prototype capillary<br />

discharge plasma source developed at the University <strong>of</strong> L‟Aquila and emitting 1.5 ns long pulses <strong>of</strong> coherent<br />

radiation at λ = 46.9 nm with 0.1 Hz maximum repetition rate, exploiting the single pass amplification <strong>of</strong> the<br />

3p-3s transition in Ne-like Ar [6].<br />

The effects <strong>of</strong> the grating surface modulation on the emission properties have been studied as a function <strong>of</strong><br />

the grating period (easily and cheaply tunable with the XIL technique) and <strong>of</strong> the organic layer thickness. A<br />

morphological characterization has been performed by Atomic Force Microscopy on both the grating surface<br />

and the active layer surface. Detailed X-Ray Photo-Emission Spectroscopy measures have been performed to<br />

complete the characterization <strong>of</strong> the device.<br />

3 – Conclusion<br />

The largely diffused use <strong>of</strong> wide-band optical networks and the increasing request <strong>of</strong> improving their<br />

performance are pushing toward the concept <strong>of</strong> an all-optical information processing. The fabrication <strong>of</strong> a<br />

miniaturized organic laser for C-band applications is a step toward an all-optical scenario. The technological<br />

impact <strong>of</strong> the novel device will depend on the possibility to adopt the on-chip optical interconnection<br />

strategy diffusely: the low costs <strong>of</strong> constituent materials and fabrication techniques are the premise for a vast<br />

diffusion <strong>of</strong> the ErQ3-based laser throughout the network.<br />

[1] M. Casalboni, F. De Matteis, V. Merlo, P. Prosposito, R. Russo and S. Schutzmann, Appl. Phys. Lett. 83, 416 (2003).<br />

[2] K. Yamashita, T. Kuro, K. Oe and H. Yanagi, Appl. Phys. Lett. 88, 241110 (2006).<br />

[3] J. Thompson, M. Anni, S. Lattante, D. Pisignano, R. I. R. Blyth, G. Gigli and R. Cingolani, Synth. Met. 143, 305 (2004).<br />

[4] P. Del Carro, A. Camposeo, R. Stabile, E. Mele, L. Persano, R. Cingolani, and D. Pisignano, Appl. Phys. Lett. 89, 201105 (2006).<br />

[5] P. Zuppella, D. Luciani, P. Tucceri, P. De Marco, A. Gaudieri, J. Kaiser, L. Ottaviano, S. Santucci and A. Reale, Nanotechnology, 20 (2009),<br />

115303.<br />

[6] A. Ritucci, G. Tomassetti, A. Reale, F. Flora and L. Mezi, Phys. Rev. A 70, 023818 (2004).<br />

57

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