PCT/1999/48 : PCT Gazette, Weekly Issue No. 48, 1999 - WIPO
PCT/1999/48 : PCT Gazette, Weekly Issue No. 48, 1999 - WIPO
PCT/1999/48 : PCT Gazette, Weekly Issue No. 48, 1999 - WIPO
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<strong>48</strong>/<strong>1999</strong><br />
14168 <strong>PCT</strong> <strong>Gazette</strong> - Section I - <strong>Gazette</strong> du <strong>PCT</strong> 2 Dec/déc <strong>1999</strong><br />
(71) ALUMINIUM RANSHOFEN WALZ-<br />
WERK GESELLSCHAFT MBH [AT/AT];<br />
A–5282 Ranshofen (AT).<br />
(for all designated States except / pour tous<br />
les États désignés sauf US)<br />
(72, 75) PLAKOLM, Markus [AT/AT]; Badstrasse<br />
15, A–<strong>48</strong>73 Frankenburg (AT).<br />
MÜLLER, Frank [DE/DE]; Kreuzbergerfeld<br />
11, D–84359 Simbach am Inn (DE).<br />
EDER, Franz [AT/AT]; Sportplatzstrasse<br />
12, A–5261 Uttendorf (AT).<br />
(74) WILHELMS, KILIAN & PARTNER;<br />
Eduard–Schmid–Strasse<br />
München (DE).<br />
2, D–81541<br />
(81) BR CA JP KR US; EP (AT BE CH CY DE<br />
DK ES FI FR GB GR IE IT LU MC NL PT<br />
SE).<br />
(51) 6 B32B 17/10, C08K 5/098<br />
(11) WO 99/61243 (13) A1<br />
(21) <strong>PCT</strong>/US98/10580<br />
(22) 22 May/mai 1998 (22.05.1998)<br />
(25) en (26) en<br />
(43) 2 Dec/déc <strong>1999</strong> (02.12.<strong>1999</strong>)<br />
(54) • ELIMINATING ADHESION DIFFE-<br />
RENCE DUE TO GLASS ORIEN-<br />
TATION IN LAMINATED SAFETY<br />
GLASS<br />
• ELIMINATION DES DIFFE-<br />
RENCES D’ADHERENCE DUES A<br />
L’ORIENTATION DU VERRE DANS<br />
UN VERRE DE SECURITE STRATIFIE<br />
(71) E.I. DU PONT DE NEMOURS AND<br />
COMPANY [US/US]; 1007 Market Street,<br />
Wilmington, DE 19898 (US).<br />
(for all designated States except / pour tous<br />
les États désignés sauf US)<br />
(72, 75) FUGIEL, Richard, Anthony, Walter<br />
[US/US]; Route 1, 50 Wakefield Addition,<br />
Washington, WV 26181 (US). TURNBULL,<br />
John, W. [US/US]; 610 Hyde Run Drive,<br />
Wilmington, DE 19808 (US). WONG, Bert,<br />
C. [US/US]; 405 Bohl Drive, Marietta, OH<br />
45750 (US).<br />
(74) CORLE, James, T.; E.I. du Pont de<br />
Nemours and Company, Legal Patent<br />
Records Center, 1007 Market Street, Wilmington,<br />
DE 19898 (US).<br />
(81) AL AM AT AU AZ BA BB BG BR BY CA<br />
CH CN CU CZ DE DK EE ES FI GB GE<br />
GH GM GW HU ID IL IS JP KE KG KP<br />
KR KZ LC LK LR LS LT LU LV MD MG<br />
MK MN MW MX NO NZ PL PT RO RU<br />
SD SE SG SI SK SL TJ TM TR TT UA UG<br />
US UZ VN YU ZW; AP (GH GM KE LS<br />
MW SD SZ UG ZW); EA (AM AZ BY KG<br />
KZ MD RU TJ TM); EP (AT BE CH CY<br />
DE DK ES FI FR GB GR IE IT LU MC NL<br />
PT SE); OA (BF BJ CF CG CI CM GA GN<br />
ML MR NE SN TD TG).<br />
(51) 6 B32B 19/00, 5/16, D02G 3/00, H01B<br />
1/06, C11D 65/06, 3/58, 9/00, 9/02, 9/04,<br />
C01B 17/00, 33/00, 15/14, 33/12<br />
(11) WO 99/61244 (13) A1<br />
(21) <strong>PCT</strong>/US99/11257<br />
(22) 20 May/mai <strong>1999</strong> (20.05.<strong>1999</strong>)<br />
(25) en (26) en<br />
(30) 09/085,514 27 May/mai 1998<br />
(27.05.1998)<br />
(43) 2 Dec/déc <strong>1999</strong> (02.12.<strong>1999</strong>)<br />
US<br />
(54) • SILICON OXIDE PARTICLES<br />
• PARTICULES D’OXYDE DE SILICIUM<br />
(71) NANOGRAM CORPORATION [US/US];<br />
46774 Lakeview Boulevard, Fremont, CA<br />
94538 (US).<br />
(72) KUMAR, Sujeet; 39800 Fremont Boulevard,<br />
Fremont, CA 94538 (US). BI,<br />
Xiangxin; 677 Greylyn Drive, San Ramon,<br />
CA 94583 (US). KAMBE, <strong>No</strong>buyuki; 840<br />
Hobart Street, Menlo Park, CA 94025 (US).<br />
(74) DARDI, Peter, S. et al. / etc.; Westman,<br />
Champlin & Kelly, P.A., International<br />
Centre, Suite 1600, 900 Second Avenue<br />
South, Minneapolis, MN 55402–3319 (US).<br />
(81) CA CN JP KR; EP (AT BE CH CY DE DK<br />
ES FI FR GB GR IE IT LU MC NL PT SE).<br />
(51) 6 B32B 27/20, B65D 65/20<br />
(11) WO 99/61245 (13) A1<br />
(21) <strong>PCT</strong>/SE99/00843<br />
(22) 18 May/mai <strong>1999</strong> (18.05.<strong>1999</strong>)<br />
(25) en (26) en<br />
(30) 9801809–6 22 May/mai 1998<br />
(22.05.1998)<br />
(43) 2 Dec/déc <strong>1999</strong> (02.12.<strong>1999</strong>)<br />
SE<br />
(54) • A PACKAGING MATERIAL AND PA-<br />
CKAGES PRODUCED FROM THE MA-<br />
TERIAL FOR LIGHT–SENSITIVE PRO-<br />
DUCTS<br />
• MATERIAU D’EMBALLAGE ET PA-<br />
QUETS REALISES AVEC CE MATE-<br />
RIAU D’EMBALLAGE ET DESTINES<br />
AU CONDITIONNEMENT DE PRO-<br />
DUITS SENSIBLES A LA LUMIERE<br />
(71) TETRA LAVAL HOLDINGS &<br />
FINANCE S.A. [SE/SE]; Avenue<br />
Général–Guisan 70, CH–1009 Pully (SE).<br />
(for all designated States except / pour tous<br />
les États désignés sauf US)<br />
(72, 75) BERGHOLTZ, Lars [SE/SE];<br />
Rapsvägen 38, S–263 54 Höganäs (SE).<br />
KLINT, Lotta [SE/SE]; Klockaregatan 2b,<br />
S–252 49 Helsingborg (SE).<br />
(74) SUNDELL, Håkan; AB Tetra Pak, Patent<br />
Dept., Ruben Rausings gata, S–221 86 Lund<br />
(SE).<br />
(81) AE AL AM AT AU AZ BA BB BG BR BY<br />
CA CH CN CU CZ DE DK EE ES FI GB<br />
GD GE GH GM HR HU ID IL IN IS JP KE<br />
KG KP KR KZ LC LK LR LS LT LU LV<br />
MD MG MK MN MW MX NO NZ PL PT<br />
RO RU SD SE SG SI SK SL TJ TM TR TT<br />
UA UG US UZ VN YU ZA ZW; AP (GH<br />
GM KE LS MW SD SL SZ UG ZW); EA<br />
(AM AZ BY KG KZ MD RU TJ TM); EP<br />
(ATBECHCYDEDKESFIFRGBGR<br />
IE IT LU MC NL PT SE); OA (BF BJ CF<br />
CG CI CM GA GN GW ML MR NE SN TD<br />
TG).<br />
(51) 6 B32B 27/32, C08L 51/06, C09J 151/06,<br />
C08F 255/02<br />
(11) WO 99/61246<br />
(21) <strong>PCT</strong>/FR99/01226<br />
(13) A1<br />
(22) 26 May/mai <strong>1999</strong> (26.05.<strong>1999</strong>)<br />
(25) fr (26) fr<br />
(30) 98/06601 26 May/mai 1998<br />
(26.05.1998)<br />
FR<br />
(43) 2 Dec/déc <strong>1999</strong> (02.12.<strong>1999</strong>)<br />
(54) • STRUCTURES COMPRISING MEAN<br />
DENSITY POLYETHYLENE AND BIN-<br />
DERS USED IN SAID STRUCTURES<br />
• STRUCTURES COMPRENANT DU<br />
POLYETHYLENE MOYENNE DEN-<br />
SITE ET LIANTS UTILISES DANS<br />
CES STRUCTURES<br />
(71) ELF ATOCHEM S.A. [FR/FR]; 4/8, cours<br />
Michelet, F–92800 Puteaux (FR).<br />
(for all designated States except / pour tous<br />
les États désignés sauf US)<br />
(72, 75) JACQUEMET, Régis [FR/FR]; 69, rue<br />
d’en Bas, F–62000 Daunville (FR). PER-<br />
RET, Patrice [FR/FR]; 7, parc Maubuisson,<br />
F–27470 Serquigny (FR). ROBERT, Patrice<br />
[FR/FR]; 7, impasse de la Risle, F–27170<br />
Beaumont le Roger (FR).<br />
(74) NEEL, Henry; ELF Atochem S.A., Dépt.<br />
Propriété Industrielle, Cours Michelet – La<br />
Défense 10, F–92091 Paris–La Défense Cedex<br />
(FR).<br />
(81) AL AM AT AU AZ BA BB BG BR BY CA<br />
CH CN CU CZ DE DK EE ES FI GB GD<br />
GE GH GM HR HU ID IL IN IS JP KE KG<br />
KP KR KZ LC LK LR LS LT LU LV MD<br />
MG MK MN MW MX NO NZ PL PT RO<br />
RU SD SE SG SI SK SL TJ TM TR TT UA<br />
UG US UZ VN YU ZW; AP (GH GM KE<br />
LS MW SD SL SZ UG ZW); EA (AM AZ<br />
BY KG KZ MD RU TJ TM); EP (AT BE<br />
CH CY DE DK ES FI FR GB GR IE IT LU<br />
MC NL PT SE); OA (BF BJ CF CG CI CM<br />
GA GN GW ML MR NE SN TD TG).<br />
(51) 6 B41C 1/045<br />
(11) WO 99/61247 (13) A1<br />
(21) <strong>PCT</strong>/US99/11339<br />
(22) 21 May/mai <strong>1999</strong> (21.05.<strong>1999</strong>)<br />
(25) en (26) en<br />
(30) 09/083,816 22 May/mai 1998<br />
(22.05.1998)<br />
US<br />
(43) 2 Dec/déc <strong>1999</strong> (02.12.<strong>1999</strong>)<br />
(54) • ENGRAVING SYSTEM AND METHOD<br />
COMPRISING IMPROVED IMAGING<br />
• PROCEDE ET SYSTEME DE GRA-<br />
VURE A IMAGERIE PERFECTIONNEE<br />
(71) OHIO ELECTRONIC ENGRAVERS,<br />
INC. [US/US]; 4105 Executive Drive,<br />
Dayton, OH 45430 (US).<br />
(72) FLANNERY, David, L.; 46<strong>48</strong> Rathburn<br />
Drive, Dayton, OH 45322 (US). SEITZ,<br />
David, R.; 117 Pawley’s Plantation Court,<br />
Xenia, OH 45385 (US). STAUB, Thomas,<br />
P.; 9508 Bridlewood Trail, Dayton, OH<br />
45458 (US). THOMAS, Matthew, A.; 2267<br />
Banyon Drive, Beavercreek, OH 45431 (US).