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PCT/1999/48 : PCT Gazette, Weekly Issue No. 48, 1999 - WIPO

PCT/1999/48 : PCT Gazette, Weekly Issue No. 48, 1999 - WIPO

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<strong>48</strong>/<strong>1999</strong><br />

14168 <strong>PCT</strong> <strong>Gazette</strong> - Section I - <strong>Gazette</strong> du <strong>PCT</strong> 2 Dec/déc <strong>1999</strong><br />

(71) ALUMINIUM RANSHOFEN WALZ-<br />

WERK GESELLSCHAFT MBH [AT/AT];<br />

A–5282 Ranshofen (AT).<br />

(for all designated States except / pour tous<br />

les États désignés sauf US)<br />

(72, 75) PLAKOLM, Markus [AT/AT]; Badstrasse<br />

15, A–<strong>48</strong>73 Frankenburg (AT).<br />

MÜLLER, Frank [DE/DE]; Kreuzbergerfeld<br />

11, D–84359 Simbach am Inn (DE).<br />

EDER, Franz [AT/AT]; Sportplatzstrasse<br />

12, A–5261 Uttendorf (AT).<br />

(74) WILHELMS, KILIAN & PARTNER;<br />

Eduard–Schmid–Strasse<br />

München (DE).<br />

2, D–81541<br />

(81) BR CA JP KR US; EP (AT BE CH CY DE<br />

DK ES FI FR GB GR IE IT LU MC NL PT<br />

SE).<br />

(51) 6 B32B 17/10, C08K 5/098<br />

(11) WO 99/61243 (13) A1<br />

(21) <strong>PCT</strong>/US98/10580<br />

(22) 22 May/mai 1998 (22.05.1998)<br />

(25) en (26) en<br />

(43) 2 Dec/déc <strong>1999</strong> (02.12.<strong>1999</strong>)<br />

(54) • ELIMINATING ADHESION DIFFE-<br />

RENCE DUE TO GLASS ORIEN-<br />

TATION IN LAMINATED SAFETY<br />

GLASS<br />

• ELIMINATION DES DIFFE-<br />

RENCES D’ADHERENCE DUES A<br />

L’ORIENTATION DU VERRE DANS<br />

UN VERRE DE SECURITE STRATIFIE<br />

(71) E.I. DU PONT DE NEMOURS AND<br />

COMPANY [US/US]; 1007 Market Street,<br />

Wilmington, DE 19898 (US).<br />

(for all designated States except / pour tous<br />

les États désignés sauf US)<br />

(72, 75) FUGIEL, Richard, Anthony, Walter<br />

[US/US]; Route 1, 50 Wakefield Addition,<br />

Washington, WV 26181 (US). TURNBULL,<br />

John, W. [US/US]; 610 Hyde Run Drive,<br />

Wilmington, DE 19808 (US). WONG, Bert,<br />

C. [US/US]; 405 Bohl Drive, Marietta, OH<br />

45750 (US).<br />

(74) CORLE, James, T.; E.I. du Pont de<br />

Nemours and Company, Legal Patent<br />

Records Center, 1007 Market Street, Wilmington,<br />

DE 19898 (US).<br />

(81) AL AM AT AU AZ BA BB BG BR BY CA<br />

CH CN CU CZ DE DK EE ES FI GB GE<br />

GH GM GW HU ID IL IS JP KE KG KP<br />

KR KZ LC LK LR LS LT LU LV MD MG<br />

MK MN MW MX NO NZ PL PT RO RU<br />

SD SE SG SI SK SL TJ TM TR TT UA UG<br />

US UZ VN YU ZW; AP (GH GM KE LS<br />

MW SD SZ UG ZW); EA (AM AZ BY KG<br />

KZ MD RU TJ TM); EP (AT BE CH CY<br />

DE DK ES FI FR GB GR IE IT LU MC NL<br />

PT SE); OA (BF BJ CF CG CI CM GA GN<br />

ML MR NE SN TD TG).<br />

(51) 6 B32B 19/00, 5/16, D02G 3/00, H01B<br />

1/06, C11D 65/06, 3/58, 9/00, 9/02, 9/04,<br />

C01B 17/00, 33/00, 15/14, 33/12<br />

(11) WO 99/61244 (13) A1<br />

(21) <strong>PCT</strong>/US99/11257<br />

(22) 20 May/mai <strong>1999</strong> (20.05.<strong>1999</strong>)<br />

(25) en (26) en<br />

(30) 09/085,514 27 May/mai 1998<br />

(27.05.1998)<br />

(43) 2 Dec/déc <strong>1999</strong> (02.12.<strong>1999</strong>)<br />

US<br />

(54) • SILICON OXIDE PARTICLES<br />

• PARTICULES D’OXYDE DE SILICIUM<br />

(71) NANOGRAM CORPORATION [US/US];<br />

46774 Lakeview Boulevard, Fremont, CA<br />

94538 (US).<br />

(72) KUMAR, Sujeet; 39800 Fremont Boulevard,<br />

Fremont, CA 94538 (US). BI,<br />

Xiangxin; 677 Greylyn Drive, San Ramon,<br />

CA 94583 (US). KAMBE, <strong>No</strong>buyuki; 840<br />

Hobart Street, Menlo Park, CA 94025 (US).<br />

(74) DARDI, Peter, S. et al. / etc.; Westman,<br />

Champlin & Kelly, P.A., International<br />

Centre, Suite 1600, 900 Second Avenue<br />

South, Minneapolis, MN 55402–3319 (US).<br />

(81) CA CN JP KR; EP (AT BE CH CY DE DK<br />

ES FI FR GB GR IE IT LU MC NL PT SE).<br />

(51) 6 B32B 27/20, B65D 65/20<br />

(11) WO 99/61245 (13) A1<br />

(21) <strong>PCT</strong>/SE99/00843<br />

(22) 18 May/mai <strong>1999</strong> (18.05.<strong>1999</strong>)<br />

(25) en (26) en<br />

(30) 9801809–6 22 May/mai 1998<br />

(22.05.1998)<br />

(43) 2 Dec/déc <strong>1999</strong> (02.12.<strong>1999</strong>)<br />

SE<br />

(54) • A PACKAGING MATERIAL AND PA-<br />

CKAGES PRODUCED FROM THE MA-<br />

TERIAL FOR LIGHT–SENSITIVE PRO-<br />

DUCTS<br />

• MATERIAU D’EMBALLAGE ET PA-<br />

QUETS REALISES AVEC CE MATE-<br />

RIAU D’EMBALLAGE ET DESTINES<br />

AU CONDITIONNEMENT DE PRO-<br />

DUITS SENSIBLES A LA LUMIERE<br />

(71) TETRA LAVAL HOLDINGS &<br />

FINANCE S.A. [SE/SE]; Avenue<br />

Général–Guisan 70, CH–1009 Pully (SE).<br />

(for all designated States except / pour tous<br />

les États désignés sauf US)<br />

(72, 75) BERGHOLTZ, Lars [SE/SE];<br />

Rapsvägen 38, S–263 54 Höganäs (SE).<br />

KLINT, Lotta [SE/SE]; Klockaregatan 2b,<br />

S–252 49 Helsingborg (SE).<br />

(74) SUNDELL, Håkan; AB Tetra Pak, Patent<br />

Dept., Ruben Rausings gata, S–221 86 Lund<br />

(SE).<br />

(81) AE AL AM AT AU AZ BA BB BG BR BY<br />

CA CH CN CU CZ DE DK EE ES FI GB<br />

GD GE GH GM HR HU ID IL IN IS JP KE<br />

KG KP KR KZ LC LK LR LS LT LU LV<br />

MD MG MK MN MW MX NO NZ PL PT<br />

RO RU SD SE SG SI SK SL TJ TM TR TT<br />

UA UG US UZ VN YU ZA ZW; AP (GH<br />

GM KE LS MW SD SL SZ UG ZW); EA<br />

(AM AZ BY KG KZ MD RU TJ TM); EP<br />

(ATBECHCYDEDKESFIFRGBGR<br />

IE IT LU MC NL PT SE); OA (BF BJ CF<br />

CG CI CM GA GN GW ML MR NE SN TD<br />

TG).<br />

(51) 6 B32B 27/32, C08L 51/06, C09J 151/06,<br />

C08F 255/02<br />

(11) WO 99/61246<br />

(21) <strong>PCT</strong>/FR99/01226<br />

(13) A1<br />

(22) 26 May/mai <strong>1999</strong> (26.05.<strong>1999</strong>)<br />

(25) fr (26) fr<br />

(30) 98/06601 26 May/mai 1998<br />

(26.05.1998)<br />

FR<br />

(43) 2 Dec/déc <strong>1999</strong> (02.12.<strong>1999</strong>)<br />

(54) • STRUCTURES COMPRISING MEAN<br />

DENSITY POLYETHYLENE AND BIN-<br />

DERS USED IN SAID STRUCTURES<br />

• STRUCTURES COMPRENANT DU<br />

POLYETHYLENE MOYENNE DEN-<br />

SITE ET LIANTS UTILISES DANS<br />

CES STRUCTURES<br />

(71) ELF ATOCHEM S.A. [FR/FR]; 4/8, cours<br />

Michelet, F–92800 Puteaux (FR).<br />

(for all designated States except / pour tous<br />

les États désignés sauf US)<br />

(72, 75) JACQUEMET, Régis [FR/FR]; 69, rue<br />

d’en Bas, F–62000 Daunville (FR). PER-<br />

RET, Patrice [FR/FR]; 7, parc Maubuisson,<br />

F–27470 Serquigny (FR). ROBERT, Patrice<br />

[FR/FR]; 7, impasse de la Risle, F–27170<br />

Beaumont le Roger (FR).<br />

(74) NEEL, Henry; ELF Atochem S.A., Dépt.<br />

Propriété Industrielle, Cours Michelet – La<br />

Défense 10, F–92091 Paris–La Défense Cedex<br />

(FR).<br />

(81) AL AM AT AU AZ BA BB BG BR BY CA<br />

CH CN CU CZ DE DK EE ES FI GB GD<br />

GE GH GM HR HU ID IL IN IS JP KE KG<br />

KP KR KZ LC LK LR LS LT LU LV MD<br />

MG MK MN MW MX NO NZ PL PT RO<br />

RU SD SE SG SI SK SL TJ TM TR TT UA<br />

UG US UZ VN YU ZW; AP (GH GM KE<br />

LS MW SD SL SZ UG ZW); EA (AM AZ<br />

BY KG KZ MD RU TJ TM); EP (AT BE<br />

CH CY DE DK ES FI FR GB GR IE IT LU<br />

MC NL PT SE); OA (BF BJ CF CG CI CM<br />

GA GN GW ML MR NE SN TD TG).<br />

(51) 6 B41C 1/045<br />

(11) WO 99/61247 (13) A1<br />

(21) <strong>PCT</strong>/US99/11339<br />

(22) 21 May/mai <strong>1999</strong> (21.05.<strong>1999</strong>)<br />

(25) en (26) en<br />

(30) 09/083,816 22 May/mai 1998<br />

(22.05.1998)<br />

US<br />

(43) 2 Dec/déc <strong>1999</strong> (02.12.<strong>1999</strong>)<br />

(54) • ENGRAVING SYSTEM AND METHOD<br />

COMPRISING IMPROVED IMAGING<br />

• PROCEDE ET SYSTEME DE GRA-<br />

VURE A IMAGERIE PERFECTIONNEE<br />

(71) OHIO ELECTRONIC ENGRAVERS,<br />

INC. [US/US]; 4105 Executive Drive,<br />

Dayton, OH 45430 (US).<br />

(72) FLANNERY, David, L.; 46<strong>48</strong> Rathburn<br />

Drive, Dayton, OH 45322 (US). SEITZ,<br />

David, R.; 117 Pawley’s Plantation Court,<br />

Xenia, OH 45385 (US). STAUB, Thomas,<br />

P.; 9508 Bridlewood Trail, Dayton, OH<br />

45458 (US). THOMAS, Matthew, A.; 2267<br />

Banyon Drive, Beavercreek, OH 45431 (US).

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