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Mechanics and Tribology of MEMS Materials - prod.sandia.gov ...

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Figure 6.2 Contact between an elastic sphere <strong>and</strong> a rigid flat in the presence <strong>of</strong> surface<br />

forces: (a) the DMT model; (b) the JKR model; (c) the change in radius <strong>of</strong><br />

contact as a function <strong>of</strong> applied load ........................................................................54<br />

Figure 6.3 LIGA processing <strong>prod</strong>uces distinct sidewall morphologies. (a) SEM image <strong>of</strong> a<br />

microgear, (b) higher magnification micrograph showing typical texture <strong>of</strong><br />

sidewalls....................................................................................................................55<br />

Figure 6.4 SEM <strong>of</strong> a LIGA Ni adhesion probe tip .....................................................................56<br />

Figure 6.5 Typical load-displacement curves for a LIGA probe tip on a Ni LIGA disk ...........57<br />

Figure 7.1 Surface micromachined device for quantifying friction between sidewall<br />

surfaces. The electrostatic actuators in (a) are used to pull the movable beam in<br />

contact with the fixed post shown in (b), <strong>and</strong> then rub the beam against the post ...60<br />

Figure 7.2 <strong>MEMS</strong> die sitting on a flat ground in Pyrex rod, <strong>and</strong> this inside a Pyrex tube (a),<br />

<strong>and</strong> these components inside a vial for radiation <strong>and</strong> thermal exposure in<br />

controlled environments (b)......................................................................................62<br />

Figure 7.3 Simulation results for thin ODTS (a) <strong>and</strong> PFTS (b) coatings at the GIF..................66<br />

Figure 7.4 Results <strong>of</strong> XPS dose simulations, assuming a fluence <strong>of</strong> 1 Al Kα photon per<br />

cm 2 ............................................................................................................................67<br />

Figure 7.5 Water contact angle for Si(100) samples coated with ODTS, after exposure to<br />

radiation (a) <strong>and</strong> heating to 300°C in various environments (b) ..............................68<br />

Figure 7.6 Water contact angle for Si(100) samples coated with PFTS, after exposure to<br />

radiation (a) <strong>and</strong> heating to 300°C in various environments (b) ..............................68<br />

Figure 7.7 Detailed XPS spectra for elements present in ODTS films, normalized to<br />

constant total intensity by element............................................................................70<br />

Figure 7.8 Detailed XPS spectra for elements present in PFTS films, normalized to<br />

constant total intensity by element............................................................................71<br />

Figure 7.9 Displacement versus the square <strong>of</strong> applied voltage on oscillation actuator for asdeposited<br />

ODTS <strong>and</strong> the same film exposed to 13%RH air at 300°C. The labels<br />

on the displacement curves indicate the static friction coefficient, µS , calculated<br />

based on the delay in displacement with applied voltage.........................................72<br />

Figure 8.1 Cross section <strong>of</strong> a polycrystalline silicon (polySi) anchor on single crystal Si,<br />

treated with selective tungsten. The silicon has been etched back to reveal the<br />

thin layer <strong>of</strong> tungsten covering all surfaces ..............................................................76<br />

Figure 8.2 Composition <strong>of</strong> polycrystalline surfaces treated with selective tungsten as a<br />

function <strong>of</strong> time after deposition, while stored in a desiccator.................................77<br />

Figure 8.3 Peak deconvolution <strong>and</strong> chemical assignments from the W 4F high resolution<br />

XPS spectra...............................................................................................................78<br />

Figure 8.4 Variation in the oxidation state <strong>of</strong> tungsten as a function <strong>of</strong> time after selective<br />

tungsten deposition ...................................................................................................78<br />

Figure 8.5 Friction coefficient versus oscillatory cycles (12 µm amplitude <strong>of</strong> sliding) for<br />

selective tungsten coated <strong>MEMS</strong> sidewall tribometer, <strong>and</strong> a polycrystalline<br />

silicon device treated with perfluorodecyltrichlorosilane (PFTS)............................79<br />

Figure 8.6 Contact surfaces <strong>of</strong> selective tungsten coated sidewall tribometer after running<br />

in air at 20% RH for 300,000 cycles. Image (a) shows the view <strong>of</strong> the post as<br />

seen from behind the moving beam, (b) shows the wear spot on the post, <strong>and</strong> (c)<br />

shows the corresponding contact location on the beam............................................79<br />

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