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Mechanics and Tribology of MEMS Materials - prod.sandia.gov ...

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<strong>gov</strong>erned by electrochemistry, the sidewall morphology appears to be controlled by the PMMA<br />

mold. Factors such as molecular weight <strong>of</strong> the PMMA, residual stresses, <strong>and</strong> x-ray exposure<br />

conditions are believed to be the major factors influencing the sidewall morphology <strong>of</strong> LIGA<br />

fabricated parts. At high enough local stresses, the asperities on the sidewalls would deform<br />

plastically during the initial run-in period. However, at low contact pressures, mechanical<br />

interlocking <strong>of</strong> asperities on the sidewalls <strong>of</strong> surfaces described here would have a significant<br />

influence on the adhesion <strong>of</strong> LIGA microsystems.<br />

6.4 LIGA Adhesion Probe Tips <strong>and</strong> Pull-Off Force Measurements<br />

The first task was to design an adhesion probe tip suitable to perform adhesive pull-<strong>of</strong>f<br />

measurements with commercial nanomechanical testers. The probe tips were made by LIGA<br />

processing so that the sidewall morphology <strong>of</strong> the probe closely mimics the sidewall morphology<br />

<strong>of</strong> real LIGA parts. A tip with a radius <strong>of</strong> curvature <strong>of</strong> 500 µm is shown in Fig. 6.4.<br />

Fig. 6.4. SEM <strong>of</strong> a LIGA Ni adhesion probe tip.<br />

An x-ray mask with a two dimensional array <strong>of</strong> probe tips was first prepared. Poly<br />

methylmethacrylate was used as the mold material, <strong>and</strong> synchrotron radiation was used to expose<br />

PMMA <strong>and</strong> create the LIGA molds. Mold filling in this particular case was performed by<br />

conventional electrodepostion <strong>of</strong> nickel from sulfamate baths. Probe tips <strong>of</strong> different geometries<br />

<strong>and</strong> from other electroplatable metals or alloys can be prepared.<br />

A fixture was designed <strong>and</strong> fabricated to attaché the probe tip (Fig. 6.4) to a commercial<br />

MTS Nanoindenter XP unit in place <strong>of</strong> the st<strong>and</strong>ard Berkovich diamond indenter. The probe<br />

was brought into contact with planar surface <strong>of</strong> a metallographically polished Ni disk. The disk<br />

was also prepared by electroplating Ni into 10 mm x 10 mm square molds. The nanoindenter<br />

was programmed to collect data in the negative load in the negative load regime until the<br />

surfaces are completely separated during the unloading cycle. A typical load-displacement data<br />

for the contact <strong>of</strong> the Ni probe tip on metallographically polished Ni surface is given in Fig. 6.5.<br />

The negative load or pull-<strong>of</strong>f force can be used to guide <strong>and</strong> validate analytical models to predict<br />

adhesion between LIGA fabricated parts.<br />

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