Mechanics and Tribology of MEMS Materials - prod.sandia.gov ...
Mechanics and Tribology of MEMS Materials - prod.sandia.gov ...
Mechanics and Tribology of MEMS Materials - prod.sandia.gov ...
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<strong>gov</strong>erned by electrochemistry, the sidewall morphology appears to be controlled by the PMMA<br />
mold. Factors such as molecular weight <strong>of</strong> the PMMA, residual stresses, <strong>and</strong> x-ray exposure<br />
conditions are believed to be the major factors influencing the sidewall morphology <strong>of</strong> LIGA<br />
fabricated parts. At high enough local stresses, the asperities on the sidewalls would deform<br />
plastically during the initial run-in period. However, at low contact pressures, mechanical<br />
interlocking <strong>of</strong> asperities on the sidewalls <strong>of</strong> surfaces described here would have a significant<br />
influence on the adhesion <strong>of</strong> LIGA microsystems.<br />
6.4 LIGA Adhesion Probe Tips <strong>and</strong> Pull-Off Force Measurements<br />
The first task was to design an adhesion probe tip suitable to perform adhesive pull-<strong>of</strong>f<br />
measurements with commercial nanomechanical testers. The probe tips were made by LIGA<br />
processing so that the sidewall morphology <strong>of</strong> the probe closely mimics the sidewall morphology<br />
<strong>of</strong> real LIGA parts. A tip with a radius <strong>of</strong> curvature <strong>of</strong> 500 µm is shown in Fig. 6.4.<br />
Fig. 6.4. SEM <strong>of</strong> a LIGA Ni adhesion probe tip.<br />
An x-ray mask with a two dimensional array <strong>of</strong> probe tips was first prepared. Poly<br />
methylmethacrylate was used as the mold material, <strong>and</strong> synchrotron radiation was used to expose<br />
PMMA <strong>and</strong> create the LIGA molds. Mold filling in this particular case was performed by<br />
conventional electrodepostion <strong>of</strong> nickel from sulfamate baths. Probe tips <strong>of</strong> different geometries<br />
<strong>and</strong> from other electroplatable metals or alloys can be prepared.<br />
A fixture was designed <strong>and</strong> fabricated to attaché the probe tip (Fig. 6.4) to a commercial<br />
MTS Nanoindenter XP unit in place <strong>of</strong> the st<strong>and</strong>ard Berkovich diamond indenter. The probe<br />
was brought into contact with planar surface <strong>of</strong> a metallographically polished Ni disk. The disk<br />
was also prepared by electroplating Ni into 10 mm x 10 mm square molds. The nanoindenter<br />
was programmed to collect data in the negative load in the negative load regime until the<br />
surfaces are completely separated during the unloading cycle. A typical load-displacement data<br />
for the contact <strong>of</strong> the Ni probe tip on metallographically polished Ni surface is given in Fig. 6.5.<br />
The negative load or pull-<strong>of</strong>f force can be used to guide <strong>and</strong> validate analytical models to predict<br />
adhesion between LIGA fabricated parts.<br />
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