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mathematical correction was not applicable but the rotation of the thermal output curve,<br />

as shown in Figure 5.9, was done after carrying out the thermal output experiment.<br />

Figure 5.5: Rotation of the thermal output from a strain gauge when installed on<br />

materials with different thermal exp<strong>an</strong>sion coefficients (Vishay Micro<br />

Measurements, 2007)<br />

According to Vishay Micro Measurements (2007), when the selected S-T-C<br />

number is lower th<strong>an</strong> the thermal exp<strong>an</strong>sion coefficient (CTE) of the testing material,<br />

then a solid line curve, as shown in Figure 5.5, is rotated counter-clockwise to a broken<br />

line curve (A curve). When the testing material has a higher CTE, then the B-curve is<br />

expected. Therefore, at <strong>an</strong>y given temperature on <strong>an</strong>y material, the apparent strain on<br />

the material c<strong>an</strong> be obtained by referring to the newly rotated curve.<br />

176

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