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2.3.3.1 NDT Reliability <strong>an</strong>d POD curves<br />

Georgiou (2006) defines NDT reliability as the probability of detecting a crack<br />

in a given size group under the inspection conditions <strong>an</strong>d procedures specified. In the<br />

NDT reliability methods, there are two related probabilistic methods for <strong>an</strong>alysing<br />

reliability data <strong>an</strong>d producing POD curves as functions of the flaw size a. According to<br />

him, repeat inspections of the same flaw size or the same flaw type will not necessarily<br />

result in consistent hit or miss indications. Therefore, there is a spread of detection<br />

results for each flaw size <strong>an</strong>d flaw type <strong>an</strong>d this is precisely why detection capability is<br />

expressed in statistical terms as POD. The POD curves provide reference to results that<br />

have been obtained for particular flaws using specific NDT procedures.<br />

There have been m<strong>an</strong>y researchers who put great effort into improving this<br />

reliability approach that involves POD <strong>an</strong>d POS experimentally <strong>an</strong>d numerically. Smith<br />

et al. (2004) present a new model-assisted POD which has more adv<strong>an</strong>tages over the<br />

empirical POD. With their development, a more accurate method c<strong>an</strong> be provided to set<br />

the threshold since it is better able to sample noise <strong>an</strong>d underst<strong>an</strong>d false calls <strong>an</strong>d their<br />

influence on flaw detectability. They have validated their model by comparing the<br />

calculated empirical POD curve with the calculated model based POD using validated<br />

signal (i.e. tr<strong>an</strong>sducer) <strong>an</strong>d noise models (i.e. material <strong>an</strong>d electronic noise), see Figure<br />

2.10.<br />

Figure 2.10: POD Modular Methodology (Smith et al., 2004)<br />

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