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Jahresbericht 2005 - IPHT Jena

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MAGNETIK & QUANTENELEKTRONIK / MAGNETICS & QUANTUM ELECTRONICS<br />

Fig. 1.7: Linear dependence of the domain wall<br />

velocity v on the field strength H mov in a stripe with<br />

a defect.<br />

Fig. 1.8: Distribution of the field strength necessary<br />

for nucleation of a domain wall in a GMR<br />

stripe without domain wall generator.<br />

In stripes without a domain wall generator the<br />

domain wall nucleates at one end of the stripe at<br />

a field strength H nuc = 18–26 kA/m and moves<br />

through the line within some µs. The peak field is<br />

inversely proportional to the stripe width and has<br />

a very narrow Gaussian distribution (σ ~ 0.8% of<br />

the peak field) as shown in Fig. 1.8. This field is<br />

larger than the field necessary to overcome every<br />

pinning and corresponds to the coercitive field<br />

strength H C.<br />

1.2.7 Measurement of coupling strength<br />

distribution in exchange bias film<br />

systems<br />

(Klaus Steenbeck, Roland Mattheis)<br />

The exchange bias field and the coercitivity of<br />

ferro-/antiferromagnetic (F/AF) coupled polycrystalline<br />

film systems for magnetoelectronics<br />

strongly depend on the coupling strength j of the<br />

individual grains, with their distribution function<br />

P(j) in the grain ensemble. Until now P(j) was not<br />

measurable.<br />

We quantified our proposed method to determine<br />

P(j) with low temperature torquemetry (see <strong>IPHT</strong><br />

annual report 2004) and included thermal relaxation<br />

processes in our model used to analyse the<br />

experimental non-equilibrium torque curves L(Φ).<br />

Furthermore, we performed time dependent<br />

measurements which directly show relaxation at<br />

T = 10 K.<br />

L(Φ) is the irreversible contribution to the torque<br />

exerted on the F/AF film by an in-plane rotating<br />

strong magnetic field after a rotation reversal<br />

from the cw to ccw sense. Beginning at the reversal<br />

point (Φ = 0), the film grains of coupling<br />

strength j change their magnetic states from one<br />

equilibrium (cw) to a new one (ccw) at characteristic<br />

angles Φ(j). Thus L(Φ) reflects P(j) and we<br />

derive<br />

P(j) = 1/(S(Kt) 2 ) * G(βS(j),Φ) * d2L(Φ)/dΦ2 ,<br />

where S, K, and t are the area, anisotropy constant,<br />

and thickness of the AF film, respectively.<br />

The function G was calculated in the frame of a<br />

Stoner-Wohlfarth model for 3-axial anisotropy<br />

(inset of Fig. 1.9). This model describes for a single<br />

grain the magnetization angles βS(j/Kt) at<br />

which the coupled AF net moment switches from<br />

one AF anisotropy axis to the next, thus contributing<br />

to the irreversible torque L(Φ). Thermal energy<br />

reduces this switching angle βS(j,T)< βS(j,0) as<br />

demonstrated in Fig. 1.9, because within the<br />

measuring time t > τ =10 –9s * exp(EB/kBT) an<br />

energy barrier EB can be overcome. This must be<br />

considered also at T = 10 K because the grain<br />

volume V � EB is very small. As an example<br />

Fig. 1.9: Calculated critical magnetization angles<br />

β S for switching of the AF net moment µ AF to a<br />

neighbouring easy axis as a function of the grain<br />

coupling (j/Kt). The shown parameter is the ratio<br />

(T/K) of temperature and AF anisotropy constant<br />

K.<br />

Inset: Sketch of the rotating magnetization M F<br />

and the coupled AF net moment µ AF in a film crystallite<br />

with 3 easy axes of the AF.<br />

21

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