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Discover New Applications For Low-Cost Solutions Discover ... - Xilinx

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Save Time, Money, and Space<br />

<strong>Xilinx</strong> leads the industry in 300 mm wafers and 90 nm process technologies.<br />

by Steve Sharp<br />

Senior Manager, Programmable Logic <strong>Solutions</strong> Marketing<br />

<strong>Xilinx</strong>, Inc.<br />

steve.sharp@xilinx.com<br />

<strong>Xilinx</strong> is aggressively driving down costs<br />

for its customers, especially in the area of<br />

90 nm process technology and 300 mm<br />

wafer manufacturing.<br />

The industry leader in PLD (programmable<br />

logic device) process technology<br />

since the introduction of its Virtex-E<br />

and Virtex-EM FPGA families in 1999,<br />

<strong>Xilinx</strong> was already well ahead of the<br />

Semiconductor Industry Association’s<br />

process roadmap. And we’ve maintained<br />

that lead by more than a year ever since.<br />

Our successful strategy includes partnerships<br />

with two world-class fabrication<br />

partners: IBM in the United States and<br />

UMC in Taiwan. Both companies are<br />

experts in process technology and manufacturing.<br />

They have allowed <strong>Xilinx</strong> to be<br />

the first PLD manufacturer to deliver products<br />

based on 300 mm wafers and, more<br />

recently, 90 nm process technology.<br />

Advantages Beyond Wafer-Thin<br />

Larger 300 mm wafers are imperative for<br />

lowering costs. With almost twice the usable<br />

wafer area and approximately 2.5 times the<br />

number of die per wafer, cost savings of 30%<br />

to 40% over 200 mm wafers are typical.<br />

According to Glen Yeung of the investment<br />

firm Salomon Smith Barney, “[These]<br />

300 mm facilities are the wave of the future.<br />

<strong>For</strong> both chip and equipment companies,<br />

the move is an economic imperative.”<br />

The semiconductor industry has been<br />

successful in the use of “copy exact,” which<br />

makes it effective to transition a product<br />

68 Xcell Journal Fall 2003

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