Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
- No tags were found...
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
Best Known <strong>Test</strong> Methods & Issues(1)• Two primary test methods for CAF test<strong>in</strong>g:• Surface Insulation Resistance (SIR) <strong>Test</strong> method<strong>in</strong>troduced by Telcordia.– GR-78-CORE (IPC-TM-650, Section 2.6.14.1)– <strong>Test</strong> for surface electro migration and for characteriz<strong>in</strong>gPCB lam<strong>in</strong>ates, solder<strong>in</strong>g fluxes, solder masks &conformal coat<strong>in</strong>g.– <strong>Test</strong> valid for a 25 year desired m<strong>in</strong>imum product life.Anthony WongHL Kon/Low KW<strong>BiTS</strong> 2003 10
Change language