Burn-in & Test Socket Workshop - BiTS Workshop

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Burn-in Simulation IVBiTS Burn-in & Test Socket WorkshopMarch 2-5, 2003Contact resistance: supplier “E”* Plating: NiB* Contact shape: SharpContact resistance: supplier “F”Holger HoppePage 13 .* Plating: Rhodium* Contact shape: Standard
Loader/Unloader Simulation IBiTS Burn-in & Test Socket WorkshopMarch 2-5, 2003‣Mechanical Reliability10.000 cover actuation cycles without device or with one device or with device exchange with / without R c measurementSocket actuation force by way chart‣Loader/Unloader simulationdevice shift test: X-/ Y-direction maximum allowed shiftdevice rotation testdevice drop height maximum allowed angel optimumHolger HoppePage 14 .
Page 1 and 2: Burn-in & TestSocket WorkshopMarch
Page 3 and 4: Burn-in & Test SocketWorkshopTechni
Page 5 and 6: •OverviewAgenda• Background & D
Page 7 and 8: Background & Definition• CAF is t
Page 9 and 10: Factors Contributing to CAF(1)• M
Page 11 and 12: Factors Contributing to CAF(3)• C
Page 13 and 14: Best Known Test Methods & Issues(1)
Page 19 and 20: Technical Challenges• CAF test st
Page 21 and 22: A g e n d aBiTS Burn-in & Test Sock
Page 23 and 24: Requirements for burn-in socketsBiT
Page 25 and 26: Fully Automated Burn-In Socket Test
Page 27 and 28: Fully Automated Burn-In Socket Test
Page 29 and 30: Burn-in Simulation IBiTS Burn-in &
Page 31: Burn-in Simulation IIIBiTS Burn-in
Page 35 and 36: Loader/Unloader Simulation IIIBiTS
Page 37 and 38: Loader/Unloader Simulation VBiTS Bu
Page 39 and 40: Loader/Unloader Simulation VIIBiTS
Page 41 and 42: OutlookBiTS Burn-in & Test Socket W
Page 43 and 44: Outline• Brief introduction of th
Page 45 and 46: Computers and PowerNot a New proble
Page 47 and 48: Some Types of PackagesCeramic LGA w
Page 49 and 50: Types Of SocketOpen TopNo Integral
Page 51 and 52: Thermal Difficulties• Thermal run
Page 53 and 54: Burn-inConventional System - Passiv
Page 55 and 56: Burn-inActive Thermal Control - MCC
Page 57 and 58: ConvectionHeat sink to airHeat Tran
Page 59 and 60: Thermal Issues - Heat TransferCondu
Page 61 and 62: T (Ambient)Temp of airThermal Resis
Page 63 and 64: Thermal Testing Standards- SEMITest
Page 65 and 66: Wind TunnelThermal Imaging CameraWo
Page 67 and 68: Thermal Test ChipSuppliersDelphi:ht
Page 69 and 70: Thermal Test ChipPackagingCeramic L
Page 71 and 72: Thermal Test Chip1,3 3,31,1 3,1•
Page 73 and 74: ExampleTemperature Distribution on
Page 75 and 76: ResultsSocket Modifications - Lidde
Page 77 and 78: ResultsThermal Image - Lidded Packa
Page 79 and 80: ResultsThermal Image Lidless Packag
Page 81 and 82: ResultsExperimental Thermal Image o
Page 83 and 84:
ExampleUse of Thermal Imaging to Re
Page 85:
AcknowledgementsWork presented here
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Burn-in & Test Socket Workshop - BiTS Workshop

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