Burn-in & Test Socket Workshop - BiTS Workshop

More documents

Recommendations

Info

Evaluation and release of burn-in socketsBiTS Burn-in & Test Socket WorkshopMarch 2-5, 2003‣ObjectiveEvaluate electrical and mechanical performance of new burn-insockets in the labApproaching real burn-in conditions: to simulate all processesdone with burn-in sockets in real production in short timeThermal stress with electrical function: Burn-in simulationMechanical stress + tests : Loader/Unloader simulationAlso possible: Ageing evaluation of used burn-in sockets aftera few hundreds runs in production (in comparison with anunused socket of same type)Holger HoppePage 5 .
Fully Automated Burn-In Socket Tester (FABIST) I‣General featuresBiTS Burn-in & Test Socket WorkshopMarch 2-5, 2003 Fully automated system running LabView software(mechanical control, heating control, measurement control) Loader / Unloader function with industrial robot Heating / Cooling ramp freely programmable Device exchange after each cycle, freely programmable Simultaneously 4 (different) sockets testable Engineering field for further investigations andLoader/Unloader simulation Highly flexible systemHolger HoppePage 6 .
Page 1 and 2: Burn-in & TestSocket WorkshopMarch
Page 3 and 4: Burn-in & Test SocketWorkshopTechni
Page 5 and 6: •OverviewAgenda• Background & D
Page 7 and 8: Background & Definition• CAF is t
Page 9 and 10: Factors Contributing to CAF(1)• M
Page 11 and 12: Factors Contributing to CAF(3)• C
Page 13 and 14: Best Known Test Methods & Issues(1)
Page 19 and 20: Technical Challenges• CAF test st
Page 21 and 22: A g e n d aBiTS Burn-in & Test Sock
Page 23: Requirements for burn-in socketsBiT
Page 27 and 28: Fully Automated Burn-In Socket Test
Page 29 and 30: Burn-in Simulation IBiTS Burn-in &
Page 31 and 32: Burn-in Simulation IIIBiTS Burn-in
Page 33 and 34: Loader/Unloader Simulation IBiTS Bu
Page 35 and 36: Loader/Unloader Simulation IIIBiTS
Page 37 and 38: Loader/Unloader Simulation VBiTS Bu
Page 39 and 40: Loader/Unloader Simulation VIIBiTS
Page 41 and 42: OutlookBiTS Burn-in & Test Socket W
Page 43 and 44: Outline• Brief introduction of th
Page 45 and 46: Computers and PowerNot a New proble
Page 47 and 48: Some Types of PackagesCeramic LGA w
Page 49 and 50: Types Of SocketOpen TopNo Integral
Page 51 and 52: Thermal Difficulties• Thermal run
Page 53 and 54: Burn-inConventional System - Passiv
Page 55 and 56: Burn-inActive Thermal Control - MCC
Page 57 and 58: ConvectionHeat sink to airHeat Tran
Page 59 and 60: Thermal Issues - Heat TransferCondu
Page 61 and 62: T (Ambient)Temp of airThermal Resis
Page 63 and 64: Thermal Testing Standards- SEMITest
Page 65 and 66: Wind TunnelThermal Imaging CameraWo
Page 67 and 68: Thermal Test ChipSuppliersDelphi:ht
Page 69 and 70: Thermal Test ChipPackagingCeramic L
Page 71 and 72: Thermal Test Chip1,3 3,31,1 3,1•
Page 73 and 74: ExampleTemperature Distribution on
Page 75 and 76:
ResultsSocket Modifications - Lidde
Page 77 and 78:
ResultsThermal Image - Lidded Packa
Page 79 and 80:
ResultsThermal Image Lidless Packag
Page 81 and 82:
ResultsExperimental Thermal Image o
Page 83 and 84:
ExampleUse of Thermal Imaging to Re
Page 85:
AcknowledgementsWork presented here
show all

Burn-in & Test Socket Workshop - BiTS Workshop

Create successful ePaper yourself

Delete template?

Save as template?