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Burn-in & Test Socket Workshop - BiTS Workshop

Burn-in & Test Socket Workshop - BiTS Workshop

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ResultsExperimental Thermal Image of Heat S<strong>in</strong>k• Comparison of thermal images for:a) lidded and b) bare die package.• Both images <strong>in</strong>dicate that imp<strong>in</strong>g<strong>in</strong>g air keeps “forward”heat s<strong>in</strong>k cooler.a) b)Air FlowThermal <strong>Test</strong><strong>in</strong>g of <strong>Burn</strong>-<strong>in</strong> <strong>Socket</strong>s – Forster et al. <strong>BiTS</strong> <strong>Workshop</strong>, Phoenix, Az March 2 - 5, 2003 40

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