Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Thermal <strong>Test</strong> ChipCalibration• Each temperature sensormust be calibrated.• Simple procedure –Placed <strong>in</strong> oven at knowntemperatures - resistancemeasured at m<strong>in</strong>imum of4 different temperatures.• Relationship betweentemperature andresistance is l<strong>in</strong>ear.• Equation developed foreach sensor.Temperature(C)120100806040200RTD(4) y = 338.05x - 249.09R 2 = 10.75 0.8 0.85 0.9 0.95 1 1.05Resistance (k-ohm)T = 337.62 R - 248.27T - Temp R - ResistanceCorrelation Coeff R 2 = 1Thermal <strong>Test</strong><strong>in</strong>g of <strong>Burn</strong>-<strong>in</strong> <strong>Socket</strong>s – Forster et al. <strong>BiTS</strong> <strong>Workshop</strong>, Phoenix, Az March 2 - 5, 2003 27
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