Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Best Known <strong>Test</strong> Methods & Issues(2)• CAF <strong>Test</strong> method– Sun Microsystems’ CAF Pattern (IPC <strong>in</strong> review)– Use to evaluate Alternate materials, design and PCBmanufactur<strong>in</strong>g processes.– Valid for a 20 year desired m<strong>in</strong>imum product life.– Four test patterns available to cover the four criticalPCB designs.• In L<strong>in</strong>e <strong>Test</strong> Pattern A<strong>Test</strong>PatternA1A2A3Pad size34 mils32 mils30 milsDrill hole size29.2 mils25 mils20 milsVia edge to edgedistance10.8 mils15.0 mils20.0 milsA427 mils14.5 mils25.5 milsAnthony WongHL Kon/Low KW<strong>BiTS</strong> 2003 11
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