Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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RESULTSComparison of FEA versus W<strong>in</strong>d Tunnel <strong>Test</strong><strong>in</strong>gFEA Prediction ½ model of heat s<strong>in</strong>k on flip chip bare diePredicted θja – 3.0 °C/watt Actual 3.2°C/wattThermal <strong>Test</strong><strong>in</strong>g of <strong>Burn</strong>-<strong>in</strong> <strong>Socket</strong>s – Forster et al. <strong>BiTS</strong> <strong>Workshop</strong>, Phoenix, Az March 2 - 5, 2003 39
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