SD Specifications Part 1 UHS-II Simplified Addendum - SD Association

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UHS-II Simplified Addendum Version 1.01©Copyright 2010-2013 SD Card Association4.7.3 Test ModesParameters for entering each Test mode are described as follows. The sequences for entering each testmode are shown in Figure 4-21 and Figure 4-22.TMD1 Modes: 00h: Normal Mode At OnceSetting in Sub Modes 03-01(Normal Mode) is effective immediately.After entering a test mode, it is possible to go back to Dormant state. 01h: Normal Mode Through Dormant stateSetting in Sub Modes 03-01(Normal Mode) is effective when exiting Dormant state.After entering a test mode, it is possible to go back to Dormant state. 02h: Disconnect Mode At OnceSetting in Sub Modes 03-01 (Disconnect Mode) is effective immediately.After entering a test mode, the Device cannot go Dormant state. 03h: Disconnect Mode Through Dormant stateSetting in Sub Modes 03-01 (Disconnect Mode) is effective when exiting Dormant state.After entering a test mode, the Device cannot go Dormant state.TMD2 Modes:PLL Multiplier (Bit 02-00) 000b: x15 001b:x30 010b-111b: ReservedChange of this field is effective when exiting Dormant or Re-Sync state. Clock frequency maybe changed only during Dormant or Re-Sync state.Loop Back Direction (Bit 07) 0b: Forward Loop Back (means from D0.Rx to D1.Tx) 1b: Backward Loop Back (means from D1.Rx to D0.Tx)When this bit is changed, both D0 and D1 are set to input mode immediately.28
UHS-II Simplified Addendum Version 1.01©Copyright 2010-2013 SD Card AssociationTime A = EIDL Length = After Power up 100ms (min.) (Manual Start) and after that 200us.Time B = Teidl_stb = 200us(min.)Time C = Tactivate = After Power up 100ms (min.) and after that 2ms (min.)Time D = T_EIDL_ENTRY = 4SI (min.) PHY Spec. defines as fixed but test mode defines as min.Time E = T_DMT_ENTRY = 750RCLK (min.)(DIF-Z)EIDL(DIF-PD)RCLK(DIF-Z)EIDL(DIF-PD)STB.L(DIF-L)SYNSYNCOM(K28.5)K-code(K30.7)TMD1 TMD2COM(K28.5)K-code(K30.7)TMD1 TMD2SYNTime ATime BTime C(K28.5+K30.7+TMD1+TMD2) x 4Sub Mode 03-01are effective hereRCLK(DIF-Z)SYNSYNData.0 Data.1 Data.2 Data.3 Data.4Data.NSTB.H(DIF-H)EIDL(DIF-PD)(DIF-Z)Time Cdata x NTime DTime E(DMT Ent.)(a) Normal Mode at onceTest Mode can be changed.(DIF-Z)EIDL(DIF-PD)RCLK(DIF-Z)(DIF-Z)EIDL(DIF-PD)STB.L(DIF-L)SYNSYNCOM(K28.5)K-code(K30.7)TMD1 TMD2COM(K28.5)K-code(K30.7)TMD1 TMD2STB.H(DIF-H)EIDL(DIF-PD)(DIF-Z)Time ATime BTime C(K28.5+K30.7+TMD1+TMD2) x 4Time DTime E(DMT Ent.)(DIF-Z)EIDL(DIF-PD)RCLK(DIF-Z)(DIF-Z)EIDL(DIF-PD)STB.L(DIF-L)SYNSYNData.0 Data.1 Data.2 Data.3 Data.4Data.NSTB.H(DIF-H)EIDL(DIF-PD)(DIF-Z)Time ATime BTime Cdata x NTime DTime E(DMT Ent.)(b) Normal Mode through Dormant or Re-Sync stateFigure 4-21: Normal Modes SequenceTest Mode can be changed.29
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SD Specifications Part 1 UHS-II Simplified Addendum - SD Association

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