SD Specifications Part 1 UHS-II Simplified Addendum - SD Association
SD Specifications Part 1 UHS-II Simplified Addendum - SD Association
SD Specifications Part 1 UHS-II Simplified Addendum - SD Association
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<strong>UHS</strong>-<strong>II</strong> <strong>Simplified</strong> <strong>Addendum</strong> Version 1.01©Copyright 2010-2013 <strong>SD</strong> Card <strong>Association</strong>4.7.4 An Example ProcedureAn example procedure for entering test mode is shown in Figure 4-23. This procedure is aboutBackward Loop Back test under the condition that PLL Multiplier is x30.Test EquipmentDevice under PHY testDisconnect mode at onceSupply powerExiting Dormant stateTest mode settingTMD1 = Disconnect Mode At OnceTMD2 = Backward Loop Back- Disconnect all lanes and re-connect the Test Equipmentin Backward Loopback- Start sending SYN from Test Equipment to D1 of deviceD0D0D0 is input as defaultBackward Loopback Mode iseffective.Both D0 and D1 are set toinput mode.Normal Mode through Re-SyncTest mode settingTMD1 = Normal Mode Through Re-SyncTMD2 = Backward Loop Back, PLL Multiplier x30Go Re-SyncExit Re-SyncInput Test dataLoop Back Test data...D1D1D1D1D0After device detects SYN from D1,enable D0 as output.PLL Multiplier is set to x30Figure 4-23: An Example Procedure (Backward Loop Back Test with PLL Multiplier is x30)31
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