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Single-Chip Low Power RF Transceiver for Narrowband Systems ...

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CC1021<br />

TEST1 Register<br />

(21h, <strong>for</strong> test only)<br />

REGISTER NAME Default<br />

value<br />

Active Description<br />

TEST1[7:4] CAL_DAC_OPEN[3:0] 4 - Calibration DAC override value, active when<br />

BREAK_LOOP=1<br />

TEST1[3:0] CHP_CO[3:0] 13 - Charge pump current override value<br />

TEST2 Register (22h, <strong>for</strong> test only)<br />

REGISTER NAME Default<br />

value<br />

Active Description<br />

TEST2[7] BREAK_LOOP 0 H 0: PLL loop closed<br />

1: PLL loop open<br />

TEST2[6] CHP_OVERRIDE 0 H 0: use calibrated value<br />

1: use CHP_CO[3:0] value<br />

TEST2[5] VCO_OVERRIDE 0 H 0: use calibrated value<br />

1: use VCO_AO[4:0] value<br />

TEST2[4:0] VCO_AO[4:0] 16 - VCO_ARRAY override value<br />

TEST3 Register (23h, <strong>for</strong> test only)<br />

REGISTER NAME Default<br />

value<br />

Active Description<br />

TEST3[7] VCO_CAL_MANUAL 0 H Enables “manual” VCO calibration (test only)<br />

TEST3[6] VCO_CAL_OVERRIDE 0 H Override VCO current calibration<br />

0: Use calibrated value<br />

1: Use VCO_CO[5:0] value<br />

VCO_CAL_OVERRIDE controls VCO_CAL_CLK if<br />

VCO_CAL_MANUAL=1. Negative transitions are then<br />

used to sample VCO_CAL_COMP.<br />

TEST3[5:0] VCO_CO[5:0] 6 - VCO_CAL_CURRENT override value<br />

TEST4 Register (24h, <strong>for</strong> test only)<br />

REGISTER NAME Default<br />

value<br />

Active Description<br />

TEST4[7] CHP_DISABLE 0 H Disable normal charge pump operation<br />

TEST4[6] CHP_TEST_UP 0 H Force charge pump to output “up” current<br />

TEST4[5] CHP_TEST_DN 0 H Force charge pump to output “down” current<br />

TEST4[4:3] TM_IQ[1:0] 0 - Value of differential I and Q outputs from mixer when<br />

TM_ENABLE=1<br />

0: I output negative, Q output negative<br />

1: I output negative, Q output positive<br />

2: I output positive, Q output negative<br />

3: I output positive, Q output positive<br />

TEST4[2] TM_ENABLE 0 H Enable DC control of mixer output (<strong>for</strong> testing)<br />

TEST4[1] TF_ENABLE 0 H Connect analog test module to filter inputs<br />

TEST4[0] TA_ENABLE 0 H Connect analog test module to ADC inputs<br />

If TF_ENABLE=1 or TA_ENABLE=1 in TEST4 register, then INTE<strong>RF</strong>ACE[3:0] controls analog test<br />

module:<br />

INTE<strong>RF</strong>ACE[3] = TEST_PD, INTE<strong>RF</strong>ACE[2:0] = TEST_MODE[2:0]. Otherwise, TEST_PD=1<br />

and<br />

TEST_MODE[2]=1.<br />

TEST5<br />

Register (25h, <strong>for</strong> test only)<br />

REGISTER NAME Default<br />

value<br />

Active Description<br />

TEST5[7] F_COMP_ENABLE 0 H Enable frequency comparator output F_COMP from<br />

phase detector<br />

TEST5[6] SET_DITHER_CLOCK 1 H Enable dithering of delta-sigma clock<br />

TEST5[5] ADC_TEST_OUT 0 H Outputs ADC samples on LOCK and DIO, while<br />

ADC_CLK is output on DCLK<br />

TEST5[4] CHOP_DISABLE 0 H Disable chopping in ADC integrators<br />

TEST5[3] SHAPING_DISABLE 0 H Disable ADC feedback mismatch shaping<br />

TEST5[2] VCM_ROT_DISABLE 0 H Disable rotation <strong>for</strong> VCM mismatch shaping<br />

TEST5[1:0] ADC_ROTATE[1:0] 0 - Control ADC input rotation<br />

0: Rotate in 00 01 10 11 sequence<br />

1: Rotate in 00 10 11 01 sequence<br />

2: Always use 00 position<br />

3: Rotate in 00 10 00 10 sequence<br />

SWRS045B Page 81 of 89

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