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CHEM01200604009 Sreejith Kaniyankandy - Homi Bhabha ...

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119<br />

previous section we have discussed the growth of the bleach kinetics of pure CdTe QD at 610<br />

nm shown in inset of Figure 4.2 and also depicted in Figure 4.4a can be fitted with a growth<br />

kinetics can be fitted with time constant of 500 fs. However the kinetic trace at 610 nm in<br />

presence of BQ (Inset, Figure 4.4b) can be fitted with a growth time of 200 fs. Here BQ is<br />

expected to separate out the hot electrons from the conduction band so it is expected that the<br />

growth of bleach signal will be specifically monitor the cooling dynamics of the hot holes.<br />

Here in presence of BQ the electrons will be de-coupled from the holes, as a result we will be<br />

monitoring only hole dynamics.<br />

0.0<br />

b<br />

a<br />

(mOD)<br />

-1.0<br />

-2.0<br />

-3.0<br />

c<br />

(mOD)<br />

0<br />

-1<br />

-2<br />

b<br />

c<br />

a<br />

-3<br />

-1 0 1 2 3 4 5<br />

Time Delay (ps)<br />

0 200 400 600<br />

Time Delay (ps)<br />

Figure 4.4: Normalized kinetic traces of a) CdTe, b) CdTe with BQ and c) CdTe with<br />

BA at 610 nm (1S exciton position). Inset: Same kinetic traces at shorter time scale.<br />

Figure 4.4c is the bleach kinetics of CdTe at 610 nm in presence of hole quencher (BA) can<br />

be fitted with 700 fs growth kinetics. This time constant can be attributed to cooling

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