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CHEM01200604009 Sreejith Kaniyankandy - Homi Bhabha ...

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53<br />

eliminated by use of standard which is generally a single crystal and has peak near that<br />

particular 2 value. The broadening is calculated as given below.<br />

<br />

(2.6)<br />

2 2 2<br />

D I<br />

Here<br />

D<br />

arises from domain size and<br />

L<br />

arises from instrumental factors. As mentioned<br />

earlier this is a crude method for estimating size as broadening can also arise from stress in<br />

the sample. Therefore D<br />

is also a function of stress and samples are assumed to be spherical.<br />

2.4. 2. Instrumentation<br />

Figure 2.1 shows a schematic of XRD instrument. The first step is creation X-Rays<br />

which is accomplished by bombarding high energy electrons on a metal target. By this<br />

process, apart from broad distribution of X-rays created due to deceleration on electrons also<br />

called Bremsstrahlen, sharp lines are also created which are superimposed on the broad<br />

distribution. These sharp lines arise from characteristic X-ray coming from knocking down<br />

of core electrons creating a “hole” and subsequent filling of higher electrons. Performing a<br />

diffraction experiment requires intense sharp X-ray as the diffraction angle is also dependent<br />

on x-ray energies; therefore a broad distribution is ineffective for performing diffraction. The<br />

mainly used targets in a set up are metals like copper, molybdenum, chromium etc. The<br />

filtering of broad distribution is accomplished by using a filter which has a 1 unit atomic<br />

number less than the target material. The resultant beam is further monochromatised by using<br />

a single crystal monochromator. In a PXRD, the samples in powdered form are spread over<br />

an amorphous substrate (generally glass slides) in presence of a binder like colloidion in<br />

amyl alcohol. The detectors are generally scintillation counters. The detector is scanned over

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