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CHEM01200604009 Sreejith Kaniyankandy - Homi Bhabha ...

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58<br />

Electron Gun<br />

Condenser Lenses<br />

Sample<br />

Detector<br />

Objective Lens &<br />

Diaphragm Assembly<br />

Projector Lens<br />

Image<br />

EELS Detector<br />

Figure. 2.2. Schematic of a TEM instrument<br />

The condenser lens functions as sample illuminator. Electron probe over the sample<br />

can be as small as few nm in high magnification and can also uniformly illuminate entire<br />

sample for lower magnification. Recent scanning TEMs have electron probes lesser than nm.<br />

In order to achieve this, combination of condenser lens system is used. The system also<br />

consists of what is called as condenser stigmator which corrects astigmatism arising from the<br />

condenser lenses. In TEM, stigmator is always invariably adjusted during column alignment.<br />

The specimen stage generally circular in shape, consists of a holder for the specimen where<br />

the samples are “illuminated” by electrons. The grids are placed on specimen state for<br />

imaging. In present study, carbon coated copper grid are used. The sample dispersed in a

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