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CHEM01200604009 Sreejith Kaniyankandy - Homi Bhabha ...

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54<br />

different angles and intensities are plotted with respect to angles. The peak position observed<br />

are angle where Bragg condition is satisfied.<br />

In the present thesis, we have used a Philips X-ray machine, model-PW 1710 with Ni<br />

filtered Cu Kα radiation (λ=1.5406Å), using silicon as an external standard. The<br />

measurements are performed in a range of 10˚-80˚ in a continuous scan mode, with a step<br />

width of 0.02˚, and scan of 1˚ per minute. The measurement of corresponding to each peak<br />

position and peak intensity is important for identification of materials. The measured data is<br />

compared with database of standards samples with the help of JCPDS-ICDD (Joint<br />

Committee on Powder Diffraction Standards-International Centre for Diffraction Data) [2.8].<br />

Figure. 2. 1. Schematic of a typical XRD instrument<br />

2.5. Raman Spectroscopy<br />

Raman spectroscopy is a technique complementary to infrared spectroscopy. Raman<br />

spectroscopy is used to study mainly vibrational modes in a system [2.9]. Since vibrational<br />

peaks positions are fingerprints of a molecular species it can help in characterization of a

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