V. Focused Fundamental Research - EERE - U.S. Department of ...
V. Focused Fundamental Research - EERE - U.S. Department of ...
V. Focused Fundamental Research - EERE - U.S. Department of ...
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Daniel – ORNL<br />
V.E.3 Intercalation Kinetics and Ion Mobility in Electrode Materials (ORNL)<br />
(a)<br />
(a)<br />
(b)<br />
(b)<br />
(c)<br />
Figure V - 195: Effect <strong>of</strong> mechanical damage on the ESM activity: a) 400<br />
nm deep indentation; b) 200 nm deep indentation. The indented areas are<br />
marked with circles.<br />
Samples with the NCM cathode material<br />
(Li 1.05 (Ni 1/3 Co 1/3 Mn 1/3 ) 0.95 O 2 ) were prepared using a new<br />
technique for uniformly spreading active material particles<br />
over the current collector (as opposed to traditional<br />
composite electrode samples made from slurry) which is<br />
suitable for ESM studies. The results (Figure V - 196) show<br />
significant dependence <strong>of</strong> electrochemical activity on the<br />
crystallographic features <strong>of</strong> the sample. Bias induced strain<br />
amplitude from BE-line measurements is a function <strong>of</strong><br />
location <strong>of</strong> pulse application. In addition, the amplitude <strong>of</strong><br />
normal strain in the direction <strong>of</strong> the cantilever deflection<br />
(out-<strong>of</strong>-plane) can be very different from that in the inpane<br />
direction (corresponding to cantilever torsion), which<br />
is evident in Figure V - 196b and Figure V - 196c. It can be seen<br />
that the same area <strong>of</strong> the material produces either very high<br />
or nearly zero strains depending on which <strong>of</strong> the<br />
orthogonal directions is considered. It should be noticed<br />
that some <strong>of</strong> the grain boundaries are highly active while<br />
others remain inactive under in-plane measurements (Figure<br />
V - 196c).<br />
(a)<br />
(d)<br />
Figure V - 194: ESM study <strong>of</strong> the indented thin film LiCoO2 cathode: a)<br />
indented region; b) analyzed area; c) loop opening; d) corresponding loops<br />
(b)<br />
(c)<br />
Figure V - 196: ESM <strong>of</strong> NCM grains: a) deflection; b) out-<strong>of</strong>-plane amplitude;<br />
c) in-plane amplitude<br />
FY 2011 Annual Progress Report 639 Energy Storage R&D