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S - Kam Ng PhD Dissertation Final.pdf - Digital Repository of CCEE ...

S - Kam Ng PhD Dissertation Final.pdf - Digital Repository of CCEE ...

S - Kam Ng PhD Dissertation Final.pdf - Digital Repository of CCEE ...

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204, -( )√ [( ). /]. /√( )(5.12)Normalizing the above expression by the total load (Q D + Q L ) and further expressing Eq.(5.12) in terms <strong>of</strong> the ratio <strong>of</strong> dead load to live load (Q D /Q L ) and the ratio <strong>of</strong> initial pileresistance at EOD to total load using ./, the final equation <strong>of</strong> the resistancefactor for pile setup at a target reliability index (β T ) yields to[( )( )].( )( )/√ [( ). /](5.13). /√( )5.6. Resistance Factors For SetupThe aforementioned derivation resulted in Eq. (5.13) reveals that the φ setup value isdependent on various parameters. Considering only the AASHTO (2010) strength I loadcombination, the probabilistic characteristics (γ, λ and COV) <strong>of</strong> the random variables Q D andQ L are defined in Eq. (5.2) as documented by Nowak (1999). The probabilisticcharacteristics (λ and COV) <strong>of</strong> the random variables R EOD and R setup were selected from Cases4 and 5 <strong>of</strong> Table 5.2, respectively. Therefore, the following analyses focus on the influence<strong>of</strong> the remaining random variables (β T , α, φ EOD and Q D /Q L ) on the φ setup value.Since the uncertainty for the pile resistance at EOD is lower than that for setup(COV EOD <strong>of</strong> 0.157 versus COV setup <strong>of</strong> 0.317) and both resistance mean biases are closer tounity (λ EOD = 1.111 and λ setup = 0.950), the calculated φ EOD values will likely higher than the

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