Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
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Parallel <strong>Test</strong> <strong>Dur<strong>in</strong>g</strong> <strong>Burn</strong>-<strong>in</strong>Pre <strong>Burn</strong>-<strong>in</strong> <strong>Test</strong>- DC Parametrics<strong>Test</strong>- Gross Functional<strong>Test</strong>Massively Parallel <strong>Test</strong>- Dynamic Stress<strong>in</strong>g- Long Functional <strong>Test</strong>- Pattern Sensitivity <strong>Test</strong>s- Long Cycle Time <strong>Test</strong>s- Data Retention <strong>Test</strong>s- Refresh <strong>Test</strong>sF<strong>in</strong>al <strong>Test</strong>- DC Parametrics <strong>Test</strong>- AC Parametrics <strong>Test</strong>- Speed Sort<strong>Test</strong> Offload<strong>BiTS</strong> 2003 Steps 7
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