Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
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<strong>Test</strong> <strong>Dur<strong>in</strong>g</strong> <strong>Burn</strong>-<strong>in</strong> <strong>Evolution</strong>• Bake• Static <strong>Burn</strong>-<strong>in</strong> (Power only)• Dynamic <strong>Burn</strong>-<strong>in</strong> (Plus <strong>in</strong>put)• Output Monitor<strong>in</strong>g <strong>Burn</strong>-<strong>in</strong> (Check someoutputs)• <strong>Burn</strong>-<strong>in</strong> and <strong>Test</strong> (Full functional test)All performed highly parallel<strong>BiTS</strong> 2003 Steps 3
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