Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
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Value of Offload<strong>in</strong>g F<strong>in</strong>al <strong>Test</strong>• If the burn-<strong>in</strong> system can perform a giventest, it can be much cheaper• Opportunity to perform tests at the sametime as burn-<strong>in</strong>• Experience has shown as much as 80% off<strong>in</strong>al test time can be performed dur<strong>in</strong>gburn-<strong>in</strong><strong>BiTS</strong> 2003 Steps 5