Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
You also want an ePaper? Increase the reach of your titles
YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.
Case Study 3:TDBI on Embedded NVM Embedded NVM tested only dur<strong>in</strong>g burn-<strong>in</strong> <strong>Test</strong> result correlation proven Fully <strong>in</strong>tegrated burn-<strong>in</strong> area ATE test time and ATE <strong>in</strong>vestment reducedby 60% (6 M$) Total process cost reduced by 40%3/19/2003 Strategic Use of <strong>Burn</strong> In (Tamas Kerekes) 29