Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
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Background• Device Specific Electrical Inteface– <strong>Test</strong>er channels routed to DUT (device under test)accord<strong>in</strong>g to device p<strong>in</strong>outs.– No flexibility <strong>in</strong> tool<strong>in</strong>gs.• High Tool<strong>in</strong>gs Cost– Exist<strong>in</strong>g tool<strong>in</strong>gs cannot be used if device p<strong>in</strong>outsare different.• Long Leadtime For Tool<strong>in</strong>gs– Tpyical cycle time for build<strong>in</strong>g a new electrical<strong>in</strong>terface is about 2 to 3 months.
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