Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
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Yield Increase <strong>Dur<strong>in</strong>g</strong> ramp-up (time-to-yield) <strong>Dur<strong>in</strong>g</strong> manufactur<strong>in</strong>g cycle (process control) Requires:‣ Detailed on-l<strong>in</strong>e reliability data generation‣ Real-time data process<strong>in</strong>g‣ Automated feedback of the data3/19/2003 Strategic Use of <strong>Burn</strong> In (Tamas Kerekes) 13