Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
Flexible Device ManagementuCPSPOWERSUPPLIESFPGAIOIOCHANNELSMEMDevice specific algorithms (not only flat vectors) runon the tester electronics and on the device under test3/19/2003 Strategic Use of <strong>Burn</strong> In (Tamas Kerekes) 19