Test During Burn-in Evolution - BiTS Workshop

Conclusions• With the data collected in both the Time &Frequency domains, the flexible electricalinterface concept has been proven to beviable for device testing (for SDRAM). Thereis, however, still room for improvements onthe interface between board to board.• The next challenge would be to prove out theFlexi-interface concept for higher speeddevice testings (DDR II & beyond).