Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
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Parallel <strong>Test</strong><strong>in</strong>g128 <strong>Test</strong>er I/O Channels X 32 CS = 4096 Total Device I/O P<strong>in</strong>s161616161616161612345678CS1……………………249250251252253254255256CS32<strong>BiTS</strong> 2003 Steps 4
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