Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
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Case Study 4:Fully Parallel <strong>Test</strong> on Flash 64 Mbit TSOP56 All functional test steps implemented <strong>in</strong> aparallel test (“burn-<strong>in</strong> like”) environment, asan additional process step ATE runs only DC and AC tests (85% testtime sav<strong>in</strong>g) Total process cost reduced by 50% Increased outgo<strong>in</strong>g reliability (cycl<strong>in</strong>g“gratis”), value not measured yet3/19/2003 Strategic Use of <strong>Burn</strong> In (Tamas Kerekes) 30
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