Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
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<strong>Test</strong> <strong>Evolution</strong> – External <strong>Test</strong>• Full I/O speed– Cost per channel very high ($Ks/channel)– Signal cable must be very short– GHz test<strong>in</strong>g very difficult• Full I/O width– One channel per device p<strong>in</strong>– Total device count per test very limited<strong>BiTS</strong> 2003 Steps 11
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