Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
Test During Burn-in Evolution - BiTS Workshop
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Prototype Evaluations DataTime-Doma<strong>in</strong> MeasurementsTDR (Time Doma<strong>in</strong> Reflectometry)measurements were taken tocapture any abnormalities on theimpedance profiles for thecomplete signal path.The impedance dips below50ohms at the portion of the SMM<strong>in</strong>terconnect. The SMM<strong>in</strong>terconnect is not impedancecontrol and hence causes someimpedance mismatch (it has acapacitive effect).