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Tellurite And Fluorotellurite Glasses For Active And Passive

Tellurite And Fluorotellurite Glasses For Active And Passive

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6. Optical properties; MDO 182<br />

( n<br />

− n<br />

)<br />

R f<br />

2<br />

1 2<br />

= 2<br />

( n1<br />

+ n2<br />

)<br />

(6.20)<br />

where ni is the refractive index of substance i. <strong>For</strong> an air-glass interface, such as that seen<br />

in the ellipsometry experiment, n2 (refractive index of air) is assumed unity in equation<br />

(6.20), as shown by equation (6.21).<br />

2<br />

( n −1)<br />

R f = (6.21)<br />

2<br />

( n + 1)<br />

A circular spot of light from the instruments source is focused onto the sample surface by<br />

viewing through a microscope eyepiece, to ensure the incident light is focused onto the<br />

sample surface region (i.e. the sample height is adjusted). The sample orientation is then<br />

adjusted to be flat relative to the microscope eyepiece using a second circular spot, by<br />

moving the sample stage (i.e. the angle of sample can be adjusted in two planes). The<br />

ellipsometer obtains values Ψ and ∆, by analysing the polarisation of the reflected light,<br />

and displays these values on a screen built into the instrument. These are recorded, and<br />

subsequently input into a program which uses equation (6.21) and (6.19) to calculate n<br />

for the sample, from values of Ψ and ∆.<br />

There are a number of advantages to ellipsometry. The technique is accurate and<br />

reproducible, as it measures the ratio between two values of R (the s and p component of<br />

the reflected beam). No reference is needed, except to calibrate the equipment for<br />

accuracy, and sample preparation is simple. This is because a flat surface is needed for<br />

the measurement rather than a prism. The technique is not sensitive to scatter and

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