Tellurite And Fluorotellurite Glasses For Active And Passive

7. Surface properties; MDO 278
It can be seen that the peak is highly asymmetric, incorporating higher energy shoulders
at 532.4 eV (46.3 %), and 533.9 eV (7.2 %), to the main peak at 530.6 eV (46.5 %). This
peak was asymmetric, with a higher bonding energy shoulder at 532.4 eV (17.5 %), to the
main peak at 530.9 eV (82.5 %). Table (7.5) summarises the quantitative analysis for this
glass from the high resolution scans.
Table (7.5): Quantitative analysis from high resolution XPS scans of polished glass
MOD015 (82.5TeO2-7.5WO3-10Nb2O5 mol. %), and theoretical peak positions and
atomic % batched.
XPS peak
Theoretical
Peak / eV At. %
High resolution XPS scan
Peak / eV At. % Wt. %
O 1s 530.4 68.35 530.5 78.52 32.23
Te 3d5/2 576.2 23.74 576.4 16.65 54.51
W 4d5/2 248.0 2.16 247.1 0.75 3.55
Nd 3d5/2 207.6 5.76 207.1 4.08 9.71
It can be seen by comparing table (7.4) and (7.5), for the polished surface and cleave
respectively, that the polished glass surface was relatively oxygen rich, and tellurium and
tungsten deficient, compared to the batched and cleaved compositions (14.9 to 65.1 %
variation from batched values).
7.2.1.3. XPS of fluorotellurite glasses
XPS spectra of two fluorotellurite glasses will be shown here, with varying melting time.
The effect of this processing should be manifested in the ratio of F1s / O1s peaks in the
XPS spectra.