Tellurite And Fluorotellurite Glasses For Active And Passive

7. Surface properties; MDO 286
Table (7.7): Quantitative analysis from high resolution XPS scans of cleaved glass
MOF001_v (65TeO2-10Na2O-25ZnF2 mol. %), and theoretical peak positions and atomic
% batched.
XPS peak
Theoretical
Peak / eV At. %
High resolution XPS scan
Peak / eV At. % Wt. %
Te 3d5/2 576.2 21.67 576.5 25.55 66.46
O 1s 530.4 46.67 530.7 50.42 16.44
Na 1s 1072.5 6.67 1071.3 6.25 2.93
Zn 2p3/2 1022.5 8.33 1021.8 7.71 10.28
F 1s 684.8 16.67 684.1 10.07 3.90
It can be seen from this table, that the quantitative analysis is once again relatively close
to the batched composition compared to the wide scan values show in fig. (7.14).
Fig. (7.20) shows the XPS wide scan of the polished surface (i.e. un-cleaved) of glass
MOF001_v (65TeO2-10Na2O-25ZnF2 mol. %), which was melted for 2 hours with
fluorinated ZnF2, for comparison.
CPS
30
25
20
15
10
5
x 10 4
Na 1s
CasaXPS
Zn 2p1/2
Zn 2p3/2
Name
F 1s
O 1s
Na 1s
Zn 2p
T e 3d
Zn 2p
Te 3s
Te MNN
O KLL
Pos.
683.94
531.44
1071.44
1021.44
576.44
FW HM
2.552
3.293
2.621
2.527
2.346
Area
1634.0
18585.6
2704.4
5610.4
28460.7
Te 3p1/2
At%
4.523
77.783
3.892
2.397
11.405
Te 3p3/2
Wide/2
1000 900 800 700 600
Binding Energy (eV)
Fig. (7.20): Wide scan XPS spectrum of polished surface of glass MOF001_v (65TeO2-
10Na2O-25ZnF2 mol. %).
F 1s
Te 3d5/2
Te 3d3/2
Te 3d
O 1s