Tellurite And Fluorotellurite Glasses For Active And Passive

7. Surface properties; MDO 274
Table (7.3): Positions of most intense fluorine (1s), zinc (2p3/2), and oxygen (1s) peaks,
from high resolutions XPS scans of as-received and fluorinated ZnF2, with atomic and
mass compositions of the powders [7].
XPS
peak
Peak /
eV
As received
Position /
Wt.%
eV
At. %
Fluorinated
Position /
Wt.%
eV
At. %
F 1s 684.8 685.2 22.82 45.40 685.1 29.78 57.95
Zn 2p3/2 1022.5 1022.8 71.58 41.38 1022.5 68.87 38.93
O 1s 530.4 532.0 5.60 13.22 531.7 1.35 3.12
These values from the high resolution scans differ significantly from the low resolution
quantitative analysis shown on fig. (7.5) and (7.6). The F1s peak shifted -0.1 eV on
fluorination, the Zn2p3/2 peak -0.3 eV, and the O1s peak -0.3 eV. The position of the
Zn2p3/2 peak was identical to the theoretical value after fluorination (1022.5 eV), and the
F1s peak shifted 0.1 eV closer to the theoretical value (684.8 eV).
7.2.1.2. XPS of oxide tellurite glasses
Fig. (7.7) shows a wide scan XPS spectrum on a cleaved surface of glass MOD015
(82.5TeO2-7.5WO3-10Nb2O5 mol. %, see chapter 3 for melting and annealing details).
The C1s peak can be seen at around 285 eV (due to contamination on sample surface).
Fig. (7.8) shows the high resolution O1s spectrum for cleaved glass MOD015.