Tellurite And Fluorotellurite Glasses For Active And Passive

7. Surface properties; MDO 281
All other high resolution peaks scanned (Na1s, Zn2p, and Te3d) were reasonably
symmetric (with a residual standard deviation between the XPS data and Gaussian /
Lorentz fit typically < 3.09). Table (7.6) summarises the quantitative analysis from the
high resolution scans, and for comparison, the actual atomic % batched and theoretical
peak positions from the NIST XPS database.
Table (7.6): Quantitative analysis from high resolution XPS scans of cleaved glass
MOF001_iii (65TeO2-10Na2O-25ZnF2 mol. %), and theoretical peak positions and
atomic % batched.
XPS peak
Theoretical
Peak / eV At. %
High resolution XPS scan
Peak / eV At. % Wt. %
Te 3d5/2 576.2 21.67 576.8 24.47 66.50
O 1s 530.4 46.67 531.0 52.15 17.77
Na 1s 1072.5 6.67 1071.2 6.18 3.02
Zn 2p3/2 1022.5 8.33 1021.9 5.82 8.10
F 1s 684.8 16.67 681.8 11.39 4.61
It can be seen from this table, that the quantitative analysis is again relatively accurate,
giving atomic % values much closer to the batched composition than the wide scan
values show in fig. (7.11).
Fig. (7.14) shows a wide scan XPS spectrum of a cleaved surface of glass MOF001_v
(65TeO2-10Na2O-25ZnF2 mol. %), which was melted for 2 hours with fluorinated ZnF2.
Fig. (7.15) shows the Na1s peak for the cleaved surface of glass MOF001_v (65TeO2-
10Na2O-25ZnF2 mol. %), which was melted for 2 hours with fluorinated ZnF2 (all high
resolution scans will be shown for this glass, regardless of symmetry, for completeness).