LANTEK User Manual - Ideal Industries

Chapter 3
Structured Cable Field Calibration and Testing
ANALYZE TESTING FOR STRUCTURED CABLE
ANALYZE SINGLE TEST MODE OVERVIEW
Analyze mode allows you to troubleshoot by running individual tests, making
adjustments, and observing changed test results. For example, a failed capacitance
measurement can indicate crimped or stretched cable. With Analyze testing, you can
walk the cable and check for damage and stretching. Freeing the cable at suspected
problem areas should improve the measured reading.
Depending on the cable type and defined test standard, any or all of the following
individual tests are available:
Wire Map Resistance Length
Capacitance NEXT Attenuation/Insertion Loss
ACR Return Loss Impedance
Delay and Skew Power Sum NEXT Power Sum ACR
Headroom ELFEXT Power Sum ELFEXT
TDR
Note: The RH is required to perform all tests with the exception of: TDR, Resistance,
Length, Capacitance, Impedance, and Delay & Skew.
Wire Map Test
Wire Map testing is used to locate shorts, opens, and miswires. Test results are
displayed graphically for easy visual indication of any problems.
Wire Map Errors
Figure 3-10: Wire Map Test Screen
A failure in a Wire Map should always be the first problem corrected, since it causes
faults in other tests. One open pin can cause DC loop resistance and attenuation tests
to fail. An open may also cause a zero capacitance reading, and will cause false
readings in NEXT tests.
A wire map test will always look for and map all nine possible wires (four pairs +
shield) but will only consider wires defined as present in the selected cable type for
pass/fail criteria. For example, a wire that is not specified in the cable type will show
on the map but will not cause a test failure.
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