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CHEM02200704003 Nilamadhab Pandhy - Homi Bhabha National ...

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Chapter 5<br />

The unimplanted specimen (Fig. 5.4a) revealed austenite microstructure in oxalic acid<br />

medium. However, the presence of martensite phase, and any abnormal ferrite phase present could<br />

not be confirmed by etching with Vilella’s reagent, and Murakami’s reagent (Fig. 5.4b-c). The<br />

reason is dissolution of superficial layer of martensite, and ferrite layer in the as polished<br />

specimens during etching. As in the case of unimplanted specimen, no ferrite microstructure was<br />

observed, for implanted specimens also it was not observed. The martensite phase at lower dose of<br />

1×10 16 N + /cm 2 could not be revealed metallographically because of unknown depth, and extent of<br />

martensite formation (Fig. 5.4d). Second important factor is that the extent of martensite formation<br />

is dependent on energy of implantation, dose rate, and type of ion implanted. The degree of<br />

martensite transformation is higher for heavier ions. Study carried out by Chayahara et al [161] to<br />

investigate martensite transformation on 304 SS by high energy (1.5 MeV) implantation of heavier<br />

ions (Au + ) using TEM has revealed fewer martensite grains. However, in the present study as the<br />

energy of implantation and mass of ion implanted are small, the martensite layer formed is very<br />

thin to reveal the microstructure metallographically. As the dose rate increases the martensite layer<br />

formation is also coupled with nitride formation [162], and this has been reflected by the<br />

disappearance of main as well as additional martensite peaks at 44.7º, 65°, and 82.3° at dose of<br />

1×10 17 N + /cm 2 , 2.5×10 17 N + /cm 2 , respectively. The martensite area provides defects and nitride<br />

nucleation sites, and acts as sinks for nitrogen [162]. Thus, at higher doses the martensite<br />

microstructure could not be revealed metallographically [21].<br />

5.2. 5 X-ray photoelectron spectroscopy study<br />

The detailed analysis of the Cr2p 3/2 and N1s energy levels has been carried out by<br />

deconvoluting the high resolution regions by asymmetric peak fitting procedure. The data<br />

presented in Fig. 5.5a-b is from the dose of 1×10 17 N + /cm 2 after sputtering for 3 min corresponding<br />

to erosion of 6 nm from the surface. The binding energy shift of Cr-Cr bond corresponding to the

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