CHEM02200704003 Nilamadhab Pandhy - Homi Bhabha National ...
CHEM02200704003 Nilamadhab Pandhy - Homi Bhabha National ...
CHEM02200704003 Nilamadhab Pandhy - Homi Bhabha National ...
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Chapter 3<br />
ionized. However, differences arise in the method of ionization, and in the formation of gas phase<br />
of the required species. The plasma from the ion source has a positive charge, and is extracted by<br />
accelerating them from the source by applying a negative potential. The ion generation and<br />
extraction system affects significantly the final beam qualities, thus careful selection of the process<br />
parameters are required. The generated ions are mass analyzed according to their e/m ratio, for<br />
allowing the single species in a defined charge state for the implantation purpose. The mass<br />
analyzer magnet is positioned along the beam path between the source and the process chamber.<br />
As the ions travel through the analyzer, magnetic field moves the ions in a circular path and the<br />
ions of mass to charge ratio that have equal centrifugal and centripetal force pass through the<br />
chamber. The magnetostatic field does not change the kinetic energy of the ions, but only changes<br />
the direction. The dose control system for an ion implantation system mounts the specimen, and<br />
also moves in a radial direction relative to an ion beam. The control system senses the beam<br />
current by a Faraday cup. This current is integrated using Eq. (1) over time of implantation to<br />
obtain the flux of charge (ions/cm 2 ) required for the desired ion dosage [57].<br />
<br />
<br />
(1)<br />
Where, is the flux of charge for the required ion dose, q is charge on the ion, A is the<br />
area of the ion beam, I is the beam current, and t is the time required for implantation.<br />
As the ions travel inside the target it undergoes series of collisions with host atoms until it<br />
finally stops at some depth known as projected range (R p ). The energy loss is due to elastic<br />
collision of the positive ions with the nuclei of the target material, and inelastic collision with the<br />
electron cloud of the target atoms. Thus, the total stopping power (S) of the target material is<br />
defined as the energy loss per unit path length travelled by the ion as represented in Eq. (2) [57].