CHEM02200704003 Nilamadhab Pandhy - Homi Bhabha National ...

Chapter 3
present on the surface for nitrogen ion implanted, and coated (Ti, TiO 2 and duplex Ti-TiO 2 ) 304L
SS.
n
R a =
i = 1
Z
i
−
Z
(5)
R q =
n
i = 1
2
( i − Z )
Z
n
(6)
Where, Z i is the height value of each single point, Z is the mean of all the height values
and, n is the number of data points within the image.
3.1.4 Surface analytical studies
3.1.4.1 Glancing Incidence X-ray Diffraction
Glancing Incidence X-ray Diffraction (GIXRD) is a versatile non-destructive technique
and is widely used for obtaining the information from thin top most layer of the materials.
Conventional X-ray diffraction technique reveals information about the top layer of a thickness in
the order 5-10 µm. In contrast, by employing glancing angle ( 1.5°) this thickness becomes an
order of magnitude smaller. Important informations that can be obtained from the GIXRD analysis
are; (a) structural changes occurring on materials by the process of ion implantation, (b) particle
size and phase analysis of thin films, (c) micro-strain present in the specimen, (d) analysis of
passive film, and (e) the characterization of corrosive deposits on the surface [72-75]. Of course,
the technique has some limitation. The first one is that it works only on very smooth surfaces, and
all the surfaces cannot be sufficiently smooth. Second is that at glancing angle most of the
incoming X-rays are wasted passing over the surface.