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CHEM02200704003 Nilamadhab Pandhy - Homi Bhabha National ...

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Chapter 3<br />

In the present investigation magnetron sputtering was used to deposit thin films of<br />

titanium (Ti), titanium dioxide (TiO 2 ) and duplex Ti-TiO 2 coating on 304L SS to investigate the<br />

effect of top-surface coating on the passive film stability and corrosion resistance in 1 M and 8 M<br />

nitric acid medium compared to uncoated specimens. The coatings were deposited by RF<br />

magnetron sputtering (Excel Instruments, India) in a custom designed 12 inch diameter chamber.<br />

Titanium (Ti) coating was deposited over 304L SS (1 cm×1 cm×1.5 cm) by sputtering titanium<br />

with 99.99 % purity at temperature of 400 °C and pressure 1×10 -1 Pa after pre-sputtering for 10<br />

min. Titanium dioxide (TiO 2 ) coating was deposited on the polished specimens of 304L SS by<br />

reactive magnetron sputtering of titanium of 99.99 % purity using Ar + and adding oxygen in the<br />

ratio of 80 sccm and 20 sccm, respectively. Prior to introduction of sputtering gas, the base<br />

pressure was 5×10 -4 Pa, and then pre-sputtering was performed for 10 min at pressure of 1×10 -1 Pa<br />

to remove the carbon contamination and hydrated layers present on the surface of target. The<br />

magnetron power used was 100 W and bias voltage applied to the target was 200 V. The distance<br />

between substrate and target was 10 cm and the substrate temperature was maintained around 200<br />

°C during deposition. Thickness of Ti and TiO 2 coating was maintained at 1 µ, respectively.<br />

Similarly, duplex Ti-TiO 2 coated specimens were prepared by first depositing Ti followed by TiO 2<br />

as explained above. The thickness of the Ti interlayer was maintained at 100 nm and the total<br />

thickness of the duplex Ti-TiO 2 coating was 1.2 µ.<br />

3.1.3 Morphological study<br />

3.1.3.1 Optical microscopy<br />

Optical microscope is the oldest and most common instrument for characterization of<br />

materials. Over the past decade enormous growth in the application of optical microscope has<br />

been witnessed in wide variety of material characterization from micron to sub-micron level.<br />

Moreover, with continued development of specialized techniques such as new light source,

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