CHEM02200704003 Nilamadhab Pandhy - Homi Bhabha National ...

Chapter 3
Fig. 3.4: Schematic of atomic force microscope [71].
In the present investigation, a NT-MDT make scanning probe microscope (Solver ProEC)
consisting of scanning tunnelling microscope (STM) and atomic force microscope was used
particularly with AFM to measure the surface topographical features of as polished, nitrogen ion
implanted, and after electrochemical potentiodynamic polarization study to examine the surface
condition before and after nitrogen ion implantation, and the extent of surface dissolution taking
place after polarization study. Similarly, it was used to study the surface topography, particle and
pore size determination of the Ti, TiO 2 and duplex Ti-TiO 2 coated 304L SS and to study the
change in surface morphology
after electrochemical polarization in 1 M and 8 M nitric acid. All
the measurements were carried out in semi-contact mode using standard conical silicon tip with
cone angle less than 20°, attached to cantilever having force constant 5 nN/m with frequency
range from 50 to 150 Hz in ambient condition. Average (R a ), and root mean square (R q ) roughness
values were calculated using Eq. 5 and Eq. 6 to get quantitative idea regarding the roughness