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Wüest M. 51 Wykes M. 82 Yamaguchi M. 17 Ybarra G. 129 Yubero F ...

Wüest M. 51 Wykes M. 82 Yamaguchi M. 17 Ybarra G. 129 Yubero F ...

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JUNE 26 MONDAY MORNING<br />

RIVA-TF-MoM-OR.6 A MINIMALIST SURFACE DECOMPOSITION METHOD AP-<br />

PLIED TO STUDY THE SURFACE CONTROL OF THE Au POLYCRYSTALLINE CO-<br />

LUMNAR FILM GROWTH. E. Rodríguez-Cañas *, and J. L. Sacedón. Instituto de Ciencia de<br />

Materiales de Madrid (CSIC), 28049 Cantoblanco, Madrid, Spain. J. A. Aznárez. Instituto de Física<br />

Aplicada (CSIC), Serrano 144, 28006 Madrid, Spain. A. I. Oliva. Cinvestav del IPN Unidad Mérida,<br />

Dpto. de Física Aplicada, AP 73- Cordemex 97310 Mérida, Yucatán, Mexico<br />

A method based in the minimalist decomposition of surface morphologies is proposed for the study<br />

of surface protrusion terminated growth fronts. The method is applied to the STM morphology images<br />

of Au films thermally evaporated on native SiOx/Si(100) for a wide range of Au thickness (60-<br />

1800 nm). In this case the bulk film morphology corresponds to a columnar competitive growth, and<br />

the growth front is composed of assembled paraboloidal meridian zones. The application of the<br />

method allows the numerical synthesis of height distribution curves by the convolution of the statistical<br />

parameters of the minimalist components. A complete set of statistical parameters, mean values<br />

and fluctuations, and their scaling during the growth are obtained. The slope at the borders of<br />

paraboloidal meridian zones are maintained near constant during the growth and appears as the controlling<br />

growth parameter. In fact its high value and the slope distribution curves can be explained by<br />

an out of equilibrium growth, controlled by steering and interface phenomena at border of the terraces<br />

in addition of an effective Ehrlich-Schwoebel step-edge barrier. The scaling agrees with simulations<br />

in which similar selected slopes are considered. One of the minimalist parameters is the fluctuation<br />

of the columnar height at the film surface, allowing to establish its relation with the other surface<br />

roughness parameters<br />

25

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